Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11688623 | Wafer inspection apparatuses | Namil Koo, Suhwan Park, Taeheung Ahn, Sangyeon OH | 2023-06-27 |
| 11029256 | Apparatus for measuring wafer | Tae-Heung Ahn, Su Hwan Park, Ki Wan Seo, Nam Il Koo, In Keun Baek +2 more | 2021-06-08 |