Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196669 | Inspection apparatus and method of inspecting wafer | Martin Priwisch, Jongmin YOON, Inkeun Baek | 2025-01-14 |
| 12165933 | Semiconductor substrate processing apparatus and semiconductor substrate measuring apparatus using the same | Inkeun Baek, Namil Koo, Junbum Park | 2024-12-10 |
| 11946881 | Inspection apparatus and inspection method using same | Martin Priwisch, Jongmin YOON, Junbum Park, Inkeun Baek, Wonki LEE +2 more | 2024-04-02 |
| 11688623 | Wafer inspection apparatuses | Racine Elysia Auxter Nassau, Namil Koo, Taeheung Ahn, Sangyeon OH | 2023-06-27 |
| 11579167 | Probe for detecting near field and near-field detection system including the same | Jongmin YOON, Namil Koo, Nagel Michael, Junbum Park, Inkeun Baek +1 more | 2023-02-14 |