Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196669 | Inspection apparatus and method of inspecting wafer | Martin Priwisch, Jongmin YOON, Suhwan Park | 2025-01-14 |
| 12165933 | Semiconductor substrate processing apparatus and semiconductor substrate measuring apparatus using the same | Namil Koo, Suhwan Park, Junbum Park | 2024-12-10 |
| 11946881 | Inspection apparatus and inspection method using same | Martin Priwisch, Jongmin YOON, Suhwan Park, Junbum Park, Wonki LEE +2 more | 2024-04-02 |
| 11680898 | Hybrid probe, physical property analysis apparatus including the same, and method of measuring semiconductor device using the apparatus | Junbum Park, Namil Koo, Jongmin YOON | 2023-06-20 |
| 11579167 | Probe for detecting near field and near-field detection system including the same | Jongmin YOON, Namil Koo, Nagel Michael, Suhwan Park, Junbum Park +1 more | 2023-02-14 |
| 11579168 | Probe for detecting near field and near-field detecting system including the same | Ikseon Jeon, Namil Koo, Junbum Park | 2023-02-14 |