Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196669 | Inspection apparatus and method of inspecting wafer | Jongmin YOON, Suhwan Park, Inkeun Baek | 2025-01-14 |
| 11946881 | Inspection apparatus and inspection method using same | Jongmin YOON, Suhwan Park, Junbum Park, Inkeun Baek, Wonki LEE +2 more | 2024-04-02 |