Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10989520 | Methods for nondestructive measurements of thickness of underlying layers | Duck Mahn Oh, Jong-An Kim, Young-Hoon Sohn, Yu-Sin Yang, Chi Hoon Lee | 2021-04-27 |
SC
Si-hyeon Choi
Overall (All Time): #2,723,647 of 4,157,543Top 70%
1
Patents All Time