Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11043814 | Apparatus for controlling ESS according to transient stability state and method thereof | Tae-Ok Kim, Gu-Han Kim, Chong-Ho Rhim, Yong-Gu Ha | 2021-06-22 |
| 10989520 | Methods for nondestructive measurements of thickness of underlying layers | Duck Mahn Oh, Si-hyeon Choi, Young-Hoon Sohn, Yu-Sin Yang, Chi Hoon Lee | 2021-04-27 |
| 9045349 | Method for preparing porous alumina | Jeong Kwon Suh, Beom Sik Kim, You In Park, Hong Chan Ahn, Yun Ho Jeong +5 more | 2015-06-02 |
| 8769292 | Method for generating standard file based on steganography technology and apparatus and method for validating integrity of metadata in the standard file | Jong Heum Kim, Pyong-Hee Han | 2014-07-01 |
| 8546154 | Apparatus and method to inspect defect of semiconductor device | Ji-Young Shin, Young-Nam Kim, Hyung-Suk Cho, Yu-Sin Yang | 2013-10-01 |
| 8153339 | Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask | Ji-Haeng Han, Young-Bae Jung, Bae-Hyoun Jung | 2012-04-10 |
| 8126258 | Method of detecting defects in patterns on semiconductor substrate by comparing second image with reference image after acquiring second image from first image and apparatus for performing the same | Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim | 2012-02-28 |
| 8055057 | Method for detecting defects in a substrate having a semiconductor device thereon | Moon-Shik Kang, Myung-Sub Lee, Yu-Sin Yang, Ji Hye Kim | 2011-11-08 |
| 8055056 | Method of detecting defects of patterns on a semiconductor substrate and apparatus for performing the same | Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim | 2011-11-08 |
| 8050488 | Method of analyzing a wafer sample | Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim | 2011-11-01 |
| 8034640 | Apparatus and method to inspect defect of semiconductor device | Ji-Young Shin, Young-Nam Kim, Hyung-Suk Cho, Yu-Sin Yang | 2011-10-11 |
| 7804591 | Wafer inspecting method | Ji Hye Kim, Yu-Sin Yang, Moon-Shik Kang, Ji-Young Shin | 2010-09-28 |
| 7767506 | Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask | Ji-Haeng Han, Young-Bae Jung, Bae-Hyoun Jung | 2010-08-03 |
| 7728966 | Optical inspection tool having lens unit with multiple beam paths for detecting surface defects of a substrate and methods of using same | Dong-Chun Lee, Chung-Sam Jun, Ik-Chul Kim, Sang Hee Kim | 2010-06-01 |
| 7449352 | Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask | Ji-Haeng Han, Young-Bae Jung, Bae-Hyoun Jung | 2008-11-11 |
| 6074974 | Manufacturing method of granulated complex molecular sieve composition having multi-functions | Jung-Min Lee, Jeong Kwon Suh, Soon Yong Jeong, Hang JIN, Byung Ki Park +5 more | 2000-06-13 |