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Apparatus for controlling ESS according to transient stability state and method thereof |
Tae-Ok Kim, Gu-Han Kim, Chong-Ho Rhim, Yong-Gu Ha |
2021-06-22 |
| 10989520 |
Methods for nondestructive measurements of thickness of underlying layers |
Duck Mahn Oh, Si-hyeon Choi, Young-Hoon Sohn, Yu-Sin Yang, Chi Hoon Lee |
2021-04-27 |
| 9045349 |
Method for preparing porous alumina |
Jeong Kwon Suh, Beom Sik Kim, You In Park, Hong Chan Ahn, Yun Ho Jeong +5 more |
2015-06-02 |
| 8769292 |
Method for generating standard file based on steganography technology and apparatus and method for validating integrity of metadata in the standard file |
Jong Heum Kim, Pyong-Hee Han |
2014-07-01 |
| 8546154 |
Apparatus and method to inspect defect of semiconductor device |
Ji-Young Shin, Young-Nam Kim, Hyung-Suk Cho, Yu-Sin Yang |
2013-10-01 |
| 8153339 |
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask |
Ji-Haeng Han, Young-Bae Jung, Bae-Hyoun Jung |
2012-04-10 |
| 8126258 |
Method of detecting defects in patterns on semiconductor substrate by comparing second image with reference image after acquiring second image from first image and apparatus for performing the same |
Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim |
2012-02-28 |
| 8055057 |
Method for detecting defects in a substrate having a semiconductor device thereon |
Moon-Shik Kang, Myung-Sub Lee, Yu-Sin Yang, Ji Hye Kim |
2011-11-08 |
| 8055056 |
Method of detecting defects of patterns on a semiconductor substrate and apparatus for performing the same |
Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim |
2011-11-08 |
| 8050488 |
Method of analyzing a wafer sample |
Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim |
2011-11-01 |
| 8034640 |
Apparatus and method to inspect defect of semiconductor device |
Ji-Young Shin, Young-Nam Kim, Hyung-Suk Cho, Yu-Sin Yang |
2011-10-11 |
| 7804591 |
Wafer inspecting method |
Ji Hye Kim, Yu-Sin Yang, Moon-Shik Kang, Ji-Young Shin |
2010-09-28 |
| 7767506 |
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask |
Ji-Haeng Han, Young-Bae Jung, Bae-Hyoun Jung |
2010-08-03 |
| 7728966 |
Optical inspection tool having lens unit with multiple beam paths for detecting surface defects of a substrate and methods of using same |
Dong-Chun Lee, Chung-Sam Jun, Ik-Chul Kim, Sang Hee Kim |
2010-06-01 |
| 7449352 |
Mask and manufacturing method of a semiconductor device and a thin film transistor array panel using the mask |
Ji-Haeng Han, Young-Bae Jung, Bae-Hyoun Jung |
2008-11-11 |
| 6074974 |
Manufacturing method of granulated complex molecular sieve composition having multi-functions |
Jung-Min Lee, Jeong Kwon Suh, Soon Yong Jeong, Hang JIN, Byung Ki Park +5 more |
2000-06-13 |
