Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11984601 | Conductive material dispersion liquid, electrode and lithium secondary battery prepared by using the same | Houng Sik Yoo, Hyeon Choi, Dong Hyun Kim, Hyun Sik Chae, Sang Hoon Choy | 2024-05-14 |
| 11845655 | Carbon nanotube dispersion and method for preparing the same | Dong Hyun Kim, Houng Sik Yoo, Jin Myung Cha, Gye Min Kwon, Hyun Sik Chae +3 more | 2023-12-19 |
| 11735735 | Method for predicting processability of electrode slurry and selecting electrode binder | Hwi-Soo YANG, Jong Heon Seol, Sang Hoon Choy | 2023-08-22 |
| 11542164 | Carbon nanotube dispersion and method for preparing the same | Dong Hyun Kim, Houng Sik Yoo, Jin Myung Cha, Gye Min Kwon, Hyun Sik Chae +3 more | 2023-01-03 |
| 11456450 | Method and apparatus for evaluating phase stability of electrode mixture slurry | Ga Hyun LIM, Jin Young Son, Hwi-Soo YANG, Jong Heon Seol, Sang Hoon Choy | 2022-09-27 |
| 11144178 | Method for providing contents for mobile terminal on the basis of user touch and hold time | — | 2021-10-12 |
| 10888870 | Grinder using induced electric field | Jin Young Son, Sang Hoon Choy, Byoung Hoon Ahn, Hyun Sik Chae | 2021-01-12 |
| 10651497 | Apparatus and method for preparing slurry for secondary battery | Jin Young Son, Sang Hoon Choy | 2020-05-12 |
| 10644316 | Anode slurry for secondary battery for improving dispersibility and reducing resistance, and anode comprising same | Jung Woo Yoo, Ye Cheol Rho, Kyung-Hwa Woo, Kwang Ho Jeong, Je-Young Kim | 2020-05-05 |
| 10535862 | System for manufacturing electrode for secondary battery having scratch tester | Jin Young Son, Jung Min YANG, Taek Soo Lee, Chan Soo JUN, Sang Hoon Choy | 2020-01-14 |
| 10516160 | Electrode for lithium secondary battery and lithium secondary battery including the same | Seul Ki Kim, Jong Heon Seol, Hee Soo Na, Chan Sub Lee, Jung Keun Yoo +1 more | 2019-12-24 |
| 10516154 | Positive electrode for lithium secondary battery and method for preparing the same | Jong Heon Seol, Jin Young Son, Sin Young Jung, Yoon Jung Choi, Yo Jin Kim +4 more | 2019-12-24 |
| 9831137 | Defect imaging apparatus, defect detection system having the same, and method of detecting defects using the same | Il-Suk PARK | 2017-11-28 |
| 9727799 | Method of automatic defect classification | Il-Suk PARK, Jeong-Ho Ahn | 2017-08-08 |
| 9194816 | Method of detecting a defect of a substrate and apparatus for performing the same | Min Ho Rim, Yu-Sin Yang, Sang-Kil Lee, Yong-Deok Jeong | 2015-11-24 |
| 8546154 | Apparatus and method to inspect defect of semiconductor device | Ji-Young Shin, Young-Nam Kim, Jong-An Kim, Yu-Sin Yang | 2013-10-01 |
| 8324571 | Apparatus and method for measuring semiconductor device | Young Seok Kim, Jong-Sun Peak, Young-Nam Kim, Sun-Jin Kang, Bu-Dl Yoo | 2012-12-04 |
| 8034640 | Apparatus and method to inspect defect of semiconductor device | Ji-Young Shin, Young-Nam Kim, Jong-An Kim, Yu-Sin Yang | 2011-10-11 |
| 6528333 | Method of and device for detecting micro-scratches | Chung-Sam Jun, Sang-Mun Chon, Sang-bong Choi, Pil-Sik Hyun, Kyu-Hong Lim +1 more | 2003-03-04 |
| 6462141 | Diene copolymer substituted by alkoxy silane, and organic and inorganic hybrid composition comprising the same | Eun Kyoung Kim, Young-Pil Kim | 2002-10-08 |
| 6449037 | Method of and device for detecting micro-scratches | Chung-Sam Jun, Sang-Mun Chon, Sang-bong Choi, Pil-Sik Hyun, Kyu-Hong Lim +1 more | 2002-09-10 |
| 6440760 | Method of measuring etched state of semiconductor wafer using optical impedence measurement | Sang-Mun Chon, Sang-bong Choi, Chung-sam Chun, Min-Sub Kang | 2002-08-27 |