Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8730475 | Method of aligning a substrate | Young Seok Kim | 2014-05-20 |
| 8324571 | Apparatus and method for measuring semiconductor device | Young Seok Kim, Young-Nam Kim, Hyung-Suk Cho, Sun-Jin Kang, Bu-Dl Yoo | 2012-12-04 |
| 8134709 | Method of aligning a substrate | Young Seok Kim | 2012-03-13 |
| 7379581 | Method for recognizing a pattern of an alignment mark on a wafer | — | 2008-05-27 |