Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10527556 | Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same | Jung Soo Kim, Young-Hoon Sohn, Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee | 2020-01-07 |
| 10281410 | Systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the same | Yu-Sin Yang, Chung-Sam Jun, Yun-Jung Jee | 2019-05-07 |
| 9194816 | Method of detecting a defect of a substrate and apparatus for performing the same | Yu-Sin Yang, Sang-Kil Lee, Yong-Deok Jeong, Hyung-Suk Cho | 2015-11-24 |