Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10989520 | Methods for nondestructive measurements of thickness of underlying layers | Jong-An Kim, Si-hyeon Choi, Young-Hoon Sohn, Yu-Sin Yang, Chi Hoon Lee | 2021-04-27 |
| 10585115 | Scanning probe inspector | Sung Yoon Ryu, Young-Hoon Sohn, Chung-Sam Jun, Yun-Jung Jee | 2020-03-10 |