JW

James M. Wark

Micron: 168 patents #58 of 6,345Top 1%
AI Aptina Imaging: 4 patents #62 of 332Top 20%
MT Mircon Technology: 1 patents #1 of 36Top 3%
📍 Boise, ID: #25 of 3,546 inventorsTop 1%
🗺 Idaho: #36 of 8,810 inventorsTop 1%
Overall (All Time): #4,642 of 4,157,543Top 1%
173
Patents All Time

Issued Patents All Time

Showing 51–75 of 173 patents

Patent #TitleCo-InventorsDate
7162796 Method of making an interposer with contact structures Salman Akram 2007-01-16
7159311 Method of making an interposer with contact structures Salman Akram 2007-01-09
7161250 Projected contact structures for engaging bumped semiconductor devices and methods of making the same Salman Akram 2007-01-09
7155300 Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs Salman Akram, Warren M. Farnworth, Derek Gochnour, David R. Hembree, Michael E. Hess +2 more 2006-12-26
7120513 Method for using data regarding manufacturing procedures integrated circuits (ICS) have undergone, such as repairs, to select procedures the ICS will undergo, such as additional repairs Salman Akram, Warren M. Farnworth, Derek Gochnour, David R. Hembree, Michael E. Hess +2 more 2006-10-10
7115495 Methods of making projected contact structures for engaging bumped semiconductor devices Salman Akram 2006-10-03
7109059 Methods for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice 2006-09-19
7060526 Wafer level methods for fabricating multi-dice chip scale semiconductor components Warren M. Farnworth, Alan G. Wood, William M. Hiatt, David R. Hembree, Kyle K. Kirby +1 more 2006-06-13
7049840 Hybrid interconnect and system for testing semiconductor dice David R. Hembree, Salman Akram, Warren M. Farnworth, Alan G. Wood, Derek Gochnour 2006-05-23
7034560 Device and method for testing integrated circuit dice in an integrated circuit module Warren M. Farnworth, Eric S. Nelson, Kevin G. Duesman 2006-04-25
7005870 Interconnect bump plate 2006-02-28
6998717 Multi-dice chip scale semiconductor components Warren M. Farnworth, Alan G. Wood, William M. Hiatt, David R. Hembree, Kyle K. Kirby +1 more 2006-02-14
6998334 Semiconductor devices with permanent polymer stencil and method for manufacturing the same Warren M. Farnworth, Alan G. Wood, David R. Hembree, Syed Sajid Ahmad, Michael E. Hess +1 more 2006-02-14
6927589 Apparatus for testing bumped die 2005-08-09
6900459 Apparatus for automatically positioning electronic dice within component packages Warren M. Farnworth, Alan G. Wood, John O. Jacobson, David R. Hembree, Jennifer L. Folaron +3 more 2005-05-31
6869826 Methods for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice 2005-03-22
6853069 Packaged die on PCB with heat sink encapsulant and methods Salman Akram 2005-02-08
6841883 Multi-dice chip scale semiconductor components and wafer level methods of fabrication Warren M. Farnworth, Alan G. Wood, William M. Hiatt, David R. Hembree, Kyle K. Kirby +1 more 2005-01-11
6841868 Memory modules including capacity for additional memory Salman Akram, David R. Hembree 2005-01-11
6815817 Underfill of a bumped or raised die utilizing barrier adjacent to the side wall of a flip-chip Salman Akram 2004-11-09
6801048 Device and method for testing integrated circuit dice in an integrated circuit module Warren M. Farnworth, Eric S. Nelson, Kevin G. Duesman 2004-10-05
6782613 Method of making an interposer with contact structures Salman Akram 2004-08-31
6730526 Multi-chip module system and method of fabrication Salman Akram, David R. Hembree 2004-05-04
6720652 Apparatus providing redundancy for fabricating highly reliable memory modules Salman Akram, David R. Hembree 2004-04-13
6710614 Methods for using an interposer/converter to allow single-sided contact to circuit modules 2004-03-23