YY

Yuichiro Yamazaki

KT Kabushiki Kaisha Toshiba: 61 patents #235 of 21,451Top 2%
EB Ebara: 19 patents #96 of 1,611Top 6%
Fujitsu Limited: 5 patents #6,029 of 24,456Top 25%
Honda Motor Co.: 3 patents #6,619 of 21,052Top 35%
TD Toshiba Storage Device: 2 patents #15 of 150Top 10%
TA Tasmit: 1 patents #2 of 13Top 20%
TL Tokyo Electron Limited: 1 patents #3,538 of 5,567Top 65%
TO Topcon: 1 patents #425 of 684Top 65%
NG Ngr: 1 patents #6 of 23Top 30%
📍 Wako, MO: #1 of 1 inventorsTop 100%
Overall (All Time): #26,446 of 4,157,543Top 1%
74
Patents All Time

Issued Patents All Time

Showing 51–74 of 74 patents

Patent #TitleCo-InventorsDate
6525328 Electron beam lithography system and pattern writing method Motosuke Miyoshi, Katsuya Okumura 2003-02-25
6512237 Charged beam exposure method and charged beam exposure apparatus Tetsuro Nakasugi, Hideaki Abe 2003-01-28
6495841 Charged beam drawing apparatus Atsushi Ando, Shunko Magoshi, Kazuyoshi Sugihara, Motosuke Miyoshi, Katsuya Okumura +1 more 2002-12-17
6376136 Charged beam exposure method Tetsuro Nakasugi, Hideaki Abe 2002-04-23
6265719 Inspection method and apparatus using electron beam Takamitsu Nagai, Motosuke Miyoshi 2001-07-24
6259094 Electron beam inspection method and apparatus Takamitsu Nagai, Motosuke Miyoshi 2001-07-10
6181501 Information recording and reproducing apparatus having an improved high frequency characteristic for a reproduction signal 2001-01-30
6171760 Lithographic method utilizing charged particle beam exposure and fluorescent film Motosuke Miyoshi 2001-01-09
6038018 Substrate inspecting apparatus, substrate inspecting system having the same apparatus and substrate inspecting method Motosuke Miyoshi 2000-03-14
5639699 Focused ion beam deposition using TMCTS Hiroko Nakamura, Haruki Komano, Kazuyoshi Sugihara, Keiji Horioka, Mitsuyo Kariya +7 more 1997-06-17
5639308 Plasma apparatus Motosuke Miyoshi, Katsuya Okumura 1997-06-17
5576833 Wafer pattern defect detection method and apparatus therefor Motosuke Miyoshi 1996-11-19
5548183 Magnetic field immersion type electron gun Motosuke Miyoshi, Katsuya Okumura 1996-08-20
5539211 Charged beam apparatus having cleaning function and method of cleaning charged beam apparatus Kenji Ohtoshi, Itsuko Sakai, Jun Takamatsu, Munehiro Ogasawara, Kazuyoshi Sugihara 1996-07-23
5535508 Method for producing an electrostatic lens Takamitsu Nagai, Motosuke Miyoshi 1996-07-16
5444256 Electrostatic lens and method for producing the same Takamitsu Nagai, Motosuke Miyoshi 1995-08-22
5429730 Method of repairing defect of structure Hiroko Nakamura, Haruki Komano, Kazuyoshi Sugihara, Keiji Horioka, Mitsuyo Kariya +7 more 1995-07-04
5413663 Plasma processing apparatus Masahiro Shimizu, Takayuki Fukasawa, Motosuke Miyoshi, Haruo Okano, Katsuya Okumura 1995-05-09
5406178 Pulse beam forming method and apparatus 1995-04-11
5371371 Magnetic immersion field emission electron gun systems capable of reducing aberration of electrostatic lens Motosuke Miyoshi, Takamitsu Nagai 1994-12-06
5362968 Optic column having particular major/minor axis magnification ratio Motosuke Miyoshi, Katsuya Okumura 1994-11-08
5293045 Electrostatic lens Motosuke Miyoshi, Katsuya Okumura 1994-03-08
5138169 Method and apparatus for irradiating low-energy electrons Motosuke Miyoshi, Katsuya Okumura 1992-08-11
4902131 Surface inspection method and apparatus therefor Motosuke Miyoshi, Shigeru Ogawa, Katsuya Okumura 1990-02-20