AA

Atsushi Ando

KT Kabushiki Kaisha Toshiba: 15 patents #1,982 of 21,451Top 10%
NT Nuflare Technology: 14 patents #26 of 298Top 9%
NT NTT: 8 patents #658 of 4,871Top 15%
Sumitomo Electric Industries: 8 patents #3,473 of 21,551Top 20%
JT Jtekt: 6 patents #275 of 1,969Top 15%
FL Fujitsu Frontech Limited: 5 patents #31 of 283Top 15%
PA Panasonic: 3 patents #7,617 of 21,108Top 40%
TL Tokyo Electron Limited: 3 patents #2,069 of 5,567Top 40%
NA Nuflare Technology America: 3 patents #4 of 10Top 40%
OL Olympus: 2 patents #1,626 of 3,097Top 55%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
NA Nachi-Fujikoshi: 1 patents #16 of 136Top 15%
AT Agency Of Industrial Science And Technology: 1 patents #568 of 1,778Top 35%
TQ Tosoh Quartz: 1 patents #9 of 29Top 35%
TK Toyoda Koki Kabushiki Kaisha: 1 patents #307 of 674Top 50%
DC Dainippon Screen Mfg. Co.: 1 patents #531 of 977Top 55%
Overall (All Time): #28,312 of 4,157,543Top 1%
71
Patents All Time

Issued Patents All Time

Showing 1–25 of 71 patents

Patent #TitleCo-InventorsDate
12394406 Paralinguistic information estimation model learning apparatus, paralinguistic information estimation apparatus, and program Hosana KAMIYAMA, Satoshi KOBASHIKAWA 2025-08-19
12339241 Multiple secondary electron beam alignment method, multiple secondary electron beam alignment apparatus, and electron beam inspection apparatus Koichi Ishii 2025-06-24
12308202 Multi-electron beam inspection apparatus, multipole array control method, and multi-electron beam inspection method Yuichi Maekawa 2025-05-20
12261015 Electron beam inspection apparatus Takahiro Murata 2025-03-25
12172864 Centering mechanism and paper sheet handling apparatus Takashi Wada, Satoshi Hayashi, Tomoyuki Tamahashi 2024-12-24
12006242 Opaque quartz glass and method of manufacturing the same Chiemi ITO, Takeshi MUTOU, Minoru Kuniyoshi, Mutsumi Asano 2024-06-11
11964839 Conveyance route switching mechanism and paper sheet handling apparatus Takashi Wada, Tomoyuki Tamahashi, Satoshi Hayashi, Shohei Koizumi, Shoichi DEGUCHI +1 more 2024-04-23
11915902 Conduction inspection method for multipole aberration corrector, and conduction inspection apparatus for multipole aberration corrector Kazuhiko Inoue 2024-02-27
11798578 Paralinguistic information estimation apparatus, paralinguistic information estimation method, and program Hosana KAMIYAMA, Satoshi KOBASHIKAWA 2023-10-24
11756554 Attribute identification method, and program Hosana KAMIYAMA, Satoshi KOBASHIKAWA 2023-09-12
11727744 Paper sheet storage apparatus and paper sheet handling apparatus Tomoyuki Tamahashi 2023-08-15
11694868 Multi-beam image acquisition apparatus and multi-beam image acquisition method Kazuhiko Inoue, Munehiro Ogasawara 2023-07-04
11557311 Satisfaction estimation model learning apparatus, satisfaction estimating apparatus, satisfaction estimation model learning method, satisfaction estimation method, and program Hosana KAMIYAMA, Satoshi KOBASHIKAWA 2023-01-17
11551708 Label generation device, model learning device, emotion recognition apparatus, methods therefor, program, and recording medium Hosana KAMIYAMA, Satoshi KOBASHIKAWA 2023-01-10
11521641 Model learning device, estimating device, methods therefor, and program Hosana KAMIYAMA, Satoshi KOBASHIKAWA 2022-12-06
11495245 Urgency level estimation apparatus, urgency level estimation method, and program Hosana KAMIYAMA, Satoshi KOBASHIKAWA 2022-11-08
D946771 Motion assisting device Hisataka Sato, Hiromichi Ohta, Nobuaki Shibata, Frederic Dandault-Kamitani, Takane Mitomi 2022-03-22
11270866 Electron beam inspection apparatus and electron beam inspection method Takahiro Murata 2022-03-08
11145485 Multiple electron beams irradiation apparatus Kazuhiko Inoue, Munehiro Ogasawara, John G. Hartley 2021-10-12
11139138 Multiple electron beams irradiation apparatus Kazuhiko Inoue, Munehiro Ogasawara, John G. Hartley 2021-10-05
11133012 Attribute identification device, attribute identification method, and program Hosana KAMIYAMA, Satoshi KOBASHIKAWA 2021-09-28
10950410 Multiple electron beam inspection apparatus with through-hole with spiral shape Kazuhiko Inoue, Munehiro Ogasawara 2021-03-16
10840057 Multiple beam inspection apparatus and sensitivity correction method for multi-detector Koichi Ishii 2020-11-17
10777384 Multiple beam image acquisition apparatus and multiple beam image acquisition method Nobutaka Kikuiri 2020-09-15
10734190 Multiple electron beam irradiation apparatus, multiple electron beam inspection apparatus and multiple electron beam irradiation method Munehiro Ogasawara, Riki Ogawa, John G. Hartley 2020-08-04