Issued Patents All Time
Showing 1–25 of 170 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12222442 | Ranging system, calibration method, program, and electronic apparatus | — | 2025-02-11 |
| 11889218 | Stacked substrate solid state image sensor | Shunichi Sukegawa, Junichi Ishibashi, Motoshige Okada | 2024-01-30 |
| 11153515 | Solid state image sensor comprising stacked substrates, semiconductor device, and electronic device | Shunichi Sukegawa, Junichi Ishibashi, Motoshige Okada | 2021-10-19 |
| 10554910 | Solid state image sensor, semiconductor device, and electronic device | Shunichi Sukegawa, Junichi Ishibashi, Motoshige Okada | 2020-02-04 |
| 9933338 | Health management system, fault diagnosis system, health management method, and fault diagnosis method | Toujirou NODA, Tadashi Suzuki, Naoki Miyakoshi, Toshiaki Kobari, Shouzou Miyabe +1 more | 2018-04-03 |
| 9779495 | Anomaly diagnosis method and apparatus | Hisae Shibuya | 2017-10-03 |
| 9733194 | Method for reviewing a defect and apparatus | Yuko Otani, Yuta Urano, Toshifumi Honda, Takehiro Hirai, Satoru Takahashi +1 more | 2017-08-15 |
| 9659250 | Facility state monitoring method and device for same | Hisae Shibuya | 2017-05-23 |
| 9483049 | Anomaly detection and diagnosis/prognosis method, anomaly detection and diagnosis/prognosis system, and anomaly detection and diagnosis/prognosis program | Hisae Shibuya | 2016-11-01 |
| 8824774 | Method and apparatus for inspecting patterns formed on a substrate | Kaoru Sakai, Hisae Shibuya, Hidetoshi Nishiyama | 2014-09-02 |
| 8811712 | Defect inspection method and device thereof | Kaoru Sakai, Hidetoshi Nishiyama | 2014-08-19 |
| 8755041 | Defect inspection method and apparatus | Yuta Urano, Akira Hamamatsu, Kaoru Sakai | 2014-06-17 |
| 8748795 | Method for inspecting pattern defect and device for realizing the same | Yuta Urano, Hiroyuki Nakano, Sachio Uto | 2014-06-10 |
| 8681328 | Dark-field defect inspecting method, dark-field defect inspecting apparatus, aberration analyzing method, and aberration analyzing apparatus | Atsushi Taniguchi, Taketo Ueno, Yukihiro Shibata, Tetsuya Matsui | 2014-03-25 |
| 8682824 | Method and device for monitoring the state of a facility | Hisae Shibuya | 2014-03-25 |
| 8660340 | Defect classification method and apparatus, and defect inspection apparatus | Hisae Shibuya, Akira Hamamatsu | 2014-02-25 |
| 8654350 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Hisae Shibuya, Yuta Urano, Toshiyuki Nakao +1 more | 2014-02-18 |
| 8643834 | Apparatus of inspecting defect in semiconductor and method of the same | Akira Hamamatsu, Hisae Shibuya | 2014-02-04 |
| 8639019 | Method and apparatus for inspecting pattern defects | Kaoru Sakai, Takafumi Okabe | 2014-01-28 |
| 8634069 | Defect inspection device and defect inspection method | Hiroyuki Nakano, Toshihiko Nakata | 2014-01-21 |
| 8630962 | Error detection method and its system for early detection of errors in a planar or facilities | Hisae Shibuya | 2014-01-14 |
| 8620061 | Visual inspection method and apparatus and image analysis system | Hisae Shibuya | 2013-12-31 |
| 8582864 | Fault inspection method | Kaoru Sakai | 2013-11-12 |
| 8553214 | Method and equipment for detecting pattern defect | Hiroaki Shishido, Yasuhiro Yoshitake, Toshihiko Nakata, Minoru Yoshida, Sachio Uto | 2013-10-08 |
| 8467594 | Method and apparatus for inspecting patterns formed on a substrate | Kaoru Sakai, Hisae Shibuya, Hidetoshi Nishiyama | 2013-06-18 |