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Vacuum compatible X-ray shield |
Casper Smit, Rients Jan de Groot |
2024-04-30 |
| 11915904 |
Reduction of thermal magnetic field noise in TEM corrector systems |
Alexander Henstra |
2024-02-27 |
| 11773905 |
Axial alignment assembly, and charged particle microscope comprising such an alignment assembly |
Casper Smit |
2023-10-03 |
| 11437216 |
Reduction of thermal magnetic field noise in TEM corrector systems |
Alexander Henstra |
2022-09-06 |
| 11417498 |
Method of manufacturing a charged particle detector |
Bart Jozef Janssen |
2022-08-16 |
| 11328892 |
Coating on dielectric insert of a resonant RF cavity |
Erik René Kieft, Jasper Frans Mathijs VAN RENS, Wouter Verhoeven, Peter Mutsaers, Jom Luiten +1 more |
2022-05-10 |
| 11101101 |
Laser-based phase plate image contrast manipulation |
Bart Buijsse, Bas Hendriksen |
2021-08-24 |
| 11101104 |
Multi modal cryo compatible GUID grid |
Maarten Kuijper, Ondrej Shanel, Mathijs Petrus Wilhelmus van den Boogaard |
2021-08-24 |
| 10921268 |
Methods and devices for preparing sample for cryogenic electron microscopy |
Bas Hendriksen, Maarten Kuijper, Luigi Mele, Erum Raja, Atieh Aminian |
2021-02-16 |
| 10410827 |
Gun lens design in a charged particle microscope |
Ali Mohammadi-Gheidari, Alexander Henstra, Peter Christiaan Tiemeijer, Kun Liu, Gregory A. Schwind +1 more |
2019-09-10 |
| 9812285 |
Holder assembly for cooperating with a nanoreactor and an electron microscope |
Luigi Mele |
2017-11-07 |
| 9741529 |
Micro-chamber for inspecting sample material |
Luigi Mele, Gerard Nicolaas Anne van Veen |
2017-08-22 |
| 9524850 |
Holder assembly for cooperating with an environmental cell and an electron microscope |
Hendrik Willem Zandbergen, Gerardus N. A. Van Veen |
2016-12-20 |
| 9162211 |
Micro-reactor for observing particles in a fluid |
Gerard Anne Nicolaas van Veen, Jacobus Peter Johannes Peters, Alan Frank de Jong |
2015-10-20 |
| 8993963 |
Mounting structures for multi-detector electron microscopes |
Hanno Sebastian von Harrach, Bert Henning Freitag |
2015-03-31 |
| 8757873 |
Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus |
Stephanus Hubertus Leonardus van den Boom, Laurens Franz Taemsz Kwakman, Uwe Luecken, Hervé-William Rémigy, Hendrik Nicolaas Slingerland +2 more |
2014-06-24 |
| 8592764 |
X-ray detector for electron microscope |
Hanno Sebastian von Harrach, Bert Henning Freitag |
2013-11-26 |
| 8410439 |
X-ray detector for electron microscope |
Hanno Sebastian von Harrach, Bert Henning Freitag |
2013-04-02 |
| D657474 |
Sample carrier |
— |
2012-04-10 |
| 8080791 |
X-ray detector for electron microscope |
Hanno Sebastian von Harrach, Bert Henning Freitag |
2011-12-20 |
| 8011259 |
Sample carrier comprising a deformable strip of material folded back upon itself and sample holder |
— |
2011-09-06 |
| 7989778 |
Charged-particle optical system with dual loading options |
Johannes Antonius Maria Van Den Oetelaar, Jorn Hermkens, Frank Nederlof, Wim Wondergem |
2011-08-02 |
| 7888655 |
Transfer mechanism for transferring a specimen |
Erik Pieter van Gaasbeek, Gerbert Jeroen van de Water, Johannes Antonius Maria van den Oetelaar, Paul Johannes L. Barends, Ian Johannes Bernardus van Hees |
2011-02-15 |
| 7767979 |
Method for coupling and disconnecting a co-operative composite structure of a sample carrier and a sample holder |
— |
2010-08-03 |