FN

Frank Nederlof

FE Fei: 2 patents #250 of 681Top 40%
U.S. Philips: 1 patents #4,133 of 8,851Top 50%
Overall (All Time): #1,523,751 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9159531 Sample carrier for an electron microscope 2015-10-13
7989778 Charged-particle optical system with dual loading options Johannes Antonius Maria Van Den Oetelaar, Jorn Hermkens, Pleun Dona, Wim Wondergem 2011-08-02
5412503 Specimen holder for a particle beam optical apparatus 1995-05-02