Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332573 | Method for determining defectiveness of pattern based on after development image | Marleen KOOIMAN, Maxim PISARENCO, Abraham SLACHTER, Bernardo Andres OYARZUN RIVERA, Wim Tjibbo Tel +1 more | 2025-06-17 |
| 12197136 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Koenraad VAN INGEN SCHENAU, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2025-01-14 |
| 11860548 | Method for characterizing a manufacturing process of semiconductor devices | Wim Tjibbo Tel, Hermanus Adrianus DILLEN, Marc Jurian Kea, Koen Thuijs, Peter David Engblom +3 more | 2024-01-02 |
| 11847570 | Deep learning for semantic segmentation of pattern | Adrianus Cornelis Matheus Koopman, Scott Anderson Middlebrooks, Antoine Gaston Marie Kiers | 2023-12-19 |
| 11768442 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Koenraad VAN INGEN SCHENAU, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2023-09-26 |
| 11733610 | Method and system to monitor a process apparatus | Wim Tjibbo Tel, Frank Staals, Paul Christiaan Hinnen | 2023-08-22 |
| 11520239 | Separation of contributions to metrology data | Wim Tjibbo Tel, Frank Staals, Roy ANUNCIADO, Marinus Jochemsen, Hugo Augustinus Joseph Cramer +2 more | 2022-12-06 |
| 11513442 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Koenraad VAN INGEN SCHENAU, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2022-11-29 |
| 11379970 | Deep learning for semantic segmentation of pattern | Adrianus Cornelis Matheus Koopman, Scott Anderson Middlebrooks, Antoine Gaston Marie Kiers | 2022-07-05 |
| 10866523 | Process window tracker | Wim Tjibbo Tel, Frank Staals | 2020-12-15 |
| 10571806 | Method and system to monitor a process apparatus | Wim Tjibbo Tel, Frank Staals, Paul Christiaan Hinnen | 2020-02-25 |