Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332573 | Method for determining defectiveness of pattern based on after development image | Marleen KOOIMAN, Maxim PISARENCO, Abraham SLACHTER, Mark John Maslow, Wim Tjibbo Tel +1 more | 2025-06-17 |