Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332573 | Method for determining defectiveness of pattern based on after development image | Marleen KOOIMAN, Abraham SLACHTER, Mark John Maslow, Bernardo Andres OYARZUN RIVERA, Wim Tjibbo Tel +1 more | 2025-06-17 |
| 12321101 | Method for applying a deposition model in a semiconductor manufacturing process | Maurits Van Der Schaar, Huaichen ZHANG, Marie-Claire VAN LARE | 2025-06-03 |
| 12271114 | Method and apparatus for predicting substrate image | Scott Anderson Middlebrooks, Adrianus Cornelis Matheus Koopman, Markus Gerardus Martinus Maria Van Kraaij, Stefan Hunsche | 2025-04-08 |
| 12259659 | Aligning a distorted image | Coen Adrianus Verschuren, Scott Anderson Middlebrooks | 2025-03-25 |
| 12204252 | Method for decision making in a semiconductor manufacturing process | Arnaud HUBAUX, Johan Franciscus Maria Beckers, Dylan John David Davies, Johan Gertrudis Cornelis Kunnen, Willem Richard Pongers +7 more | 2025-01-21 |
| 11687007 | Method for decision making in a semiconductor manufacturing process | Arnaud HUBAUX, Johan Franciscus Maria Beckers, Dylan John David Davies, Johan Gertrudis Cornelis Kunnen, Willem Richard Pongers +7 more | 2023-06-27 |
| 11536654 | Scatterometer and method of scatterometry using acoustic radiation | Nitesh Pandey, Alessandro Polo | 2022-12-27 |
| 11429763 | Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method | Remco Dirks, Markus Gerardus Martinus Maria Van Kraaij | 2022-08-30 |
| 11378891 | Method for determining contribution to a fingerprint | Davit Harutyunyan, Fei Jia, Frank Staals, Fuming Wang, Hugo Thomas Looijestijn +8 more | 2022-07-05 |
| 11347151 | Methods and apparatus for calculating electromagnetic scattering properties of a structure | Markus Gerardus Martinus Maria Van Kraaij, Richard Quintanilha | 2022-05-31 |
| 11067901 | Method and apparatus for image analysis | Scott Anderson Middlebrooks, Adrianus Cornelis Matheus Koopman, Markus Gerardus Martinus Maria Van Kraaij | 2021-07-20 |
| 11041816 | Methods and apparatus for calculating electromagnetic scattering properties of a structure and for reconstruction of approximate structures | Frank Schneider, Markus Gerardus Martinus Maria Van Kraaij, Martijn Constant Van Beurden | 2021-06-22 |
| 10845304 | Scatterometer and method of scatterometry using acoustic radiation | Nitesh Pandey, Alessandro Polo | 2020-11-24 |
| 10816904 | Method for determining contribution to a fingerprint | Davit Harutyunyan, Fei Jia, Frank Staals, Fuming Wang, Hugo Thomas Looijestijn +8 more | 2020-10-27 |
| 10649345 | Methods and apparatuses for measurement of a parameter of a feature fabricated on a substrate | Markus Gerardus Martinus Maria Van Kraaij, Sebastianus Adrianus GOORDEN | 2020-05-12 |
| 10607334 | Method and apparatus for image analysis | Scott Anderson Middlebrooks, Markus Gerardus Martinus Maria Van Kraaij, Adrianus Cornelis Matheus Koopman, Stefan Hunsche, Willem Marie Julia Marcel Coene | 2020-03-31 |
| 10592618 | Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method | Remco Dirks, Markus Gerardus Martinus Maria Van Kraaij | 2020-03-17 |
| 10444638 | Method for parameter determination and apparatus thereof | Nitesh Pandey, Alessandro Polo | 2019-10-15 |
| 10408753 | Method and apparatus for calculating electromagnetic scattering properties of finite periodic structures | Irwan Dani Setija | 2019-09-10 |
| 10146140 | Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method | Richard Quintanilha, Markus Gerardus Martinus Maria Van Kraaij | 2018-12-04 |
| 9939250 | Methods and apparatus for calculating electromagnetic scattering properties of a structure and for estimation of geometrical and material parameters thereof | Irwan Dani Setija | 2018-04-10 |
| 8875078 | Reference library generation method for methods of inspection, inspection apparatus and lithographic apparatus | Irwan Dani Setija | 2014-10-28 |