Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marie-Claire VAN LARE, Hermanus Adrianus DILLEN +5 more | 2025-08-12 |
| 12332573 | Method for determining defectiveness of pattern based on after development image | Maxim PISARENCO, Abraham SLACHTER, Mark John Maslow, Bernardo Andres OYARZUN RIVERA, Wim Tjibbo Tel +1 more | 2025-06-17 |
| 11966167 | Systems and methods for reducing resist model prediction errors | David RIO, Sander Frederik Wuister | 2024-04-23 |
| 11435671 | SEM FOV fingerprint in stochastic EPE and placement measurements in large FOV SEM devices | — | 2022-09-06 |
| 11016399 | Method for controlling a manufacturing apparatus and associated apparatuses | Sander Frederik Wuister | 2021-05-25 |