Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marleen KOOIMAN, Marie-Claire VAN LARE, Hermanus Adrianus DILLEN +5 more | 2025-08-12 |
| 12197136 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Mark John Maslow, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2025-01-14 |
| 11822255 | Process window based on defect probability | Abraham SLACHTER, Stefan Hunsche, Wim Tjibbo Tel, Anton Bernhard Van Oosten, Gijsbert Rispens +1 more | 2023-11-21 |
| 11768442 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Mark John Maslow, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2023-09-26 |
| 11733606 | Method for performing a manufacturing process and associated apparatuses | Thomas Theeuwes, Pieter J. Woltgens | 2023-08-22 |
| 11513442 | Method of determining control parameters of a device manufacturing process | Wim Tjibbo Tel, Mark John Maslow, Patrick Warnaar, Abraham SLACHTER, Roy ANUNCIADO +3 more | 2022-11-29 |
| 11079687 | Process window based on defect probability | Abraham SLACHTER, Stefan Hunsche, Wim Tjibbo Tel, Anton Bernhard Van Oosten, Gijsbert Rispens +1 more | 2021-08-03 |