Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marleen KOOIMAN, Marie-Claire VAN LARE +5 more | 2025-08-12 |
| 12315175 | Method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the method | Wim Tjibbo Tel, Antoine Gaston Marie Kiers, Vadim Yourievich TIMOSHKOV, Yichen Zhang, Te-Sheng WANG +1 more | 2025-05-27 |
| 12124179 | Method of wafer alignment using at resolution metrology on product features | Wim Tjibbo Tel, Marc Jurian Kea, Roy Werkman, Weitian Kou | 2024-10-22 |
| 11972922 | Method for calibrating a scanning charged particle microscope | Wim Tjibbo Tel, Willem Louis VAN MIERLO | 2024-04-30 |
| 11860548 | Method for characterizing a manufacturing process of semiconductor devices | Wim Tjibbo Tel, Marc Jurian Kea, Mark John Maslow, Koen Thuijs, Peter David Engblom +3 more | 2024-01-02 |
| 11796920 | Method for controlling a manufacturing process and associated apparatuses | Jochem Sebastiaan Wildenberg, Fan Feng, Ronald Van Ittersum, Willem Louis VAN MIERLO, Koen Thuijs | 2023-10-24 |
| 11733614 | Method of metrology and associated apparatuses | Thomas Jarik HUISMAN, Ruben Cornelis MAAS | 2023-08-22 |
| 11668661 | Inspection tool and inspection method | Thomas Jarik HUISMAN, Sander Frederik Wuister, Dorothea Maria Christina Oorschot | 2023-06-06 |
| 11646174 | Method for calibrating a scanning charged particle microscope | Wim Tjibbo Tel, Willem Louis VAN MIERLO | 2023-05-09 |
| 11112703 | Method of metrology and associated apparatuses | Thomas Jarik HUISMAN, Ruben Cornelis MAAS | 2021-09-07 |
| 10754256 | Method and apparatus for pattern correction and verification | Thomas I. Wallow, Peng Yang, Adam Lyons, Mir Farrokh SHAYEGAN SALEK | 2020-08-25 |