Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11972922 | Method for calibrating a scanning charged particle microscope | Hermanus Adrianus DILLEN, Wim Tjibbo Tel | 2024-04-30 |
| 11796920 | Method for controlling a manufacturing process and associated apparatuses | Jochem Sebastiaan Wildenberg, Hermanus Adrianus DILLEN, Fan Feng, Ronald Van Ittersum, Koen Thuijs | 2023-10-24 |
| 11646174 | Method for calibrating a scanning charged particle microscope | Hermanus Adrianus DILLEN, Wim Tjibbo Tel | 2023-05-09 |