Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11860548 | Method for characterizing a manufacturing process of semiconductor devices | Wim Tjibbo Tel, Hermanus Adrianus DILLEN, Marc Jurian Kea, Mark John Maslow, Peter David Engblom +3 more | 2024-01-02 |
| 11796920 | Method for controlling a manufacturing process and associated apparatuses | Jochem Sebastiaan Wildenberg, Hermanus Adrianus DILLEN, Fan Feng, Ronald Van Ittersum, Willem Louis VAN MIERLO | 2023-10-24 |
| 11561480 | System and method for inspecting a wafer | Ivo Liebregts, Niladri Sen, Ronaldus Johannes Gijsbertus Goossens | 2023-01-24 |