Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255042 | Numerically compensating SEM-induced charging using diffusion-based model | Shakeeb Bin HASAN | 2025-03-18 |
| 11733614 | Method of metrology and associated apparatuses | Ruben Cornelis MAAS, Hermanus Adrianus DILLEN | 2023-08-22 |
| 11668661 | Inspection tool and inspection method | Sander Frederik Wuister, Hermanus Adrianus DILLEN, Dorothea Maria Christina Oorschot | 2023-06-06 |
| 11243179 | Inspection tool, lithographic apparatus, electron beam source and an inspection method | Erwin Paul SMAKMAN, Albertus Victor Gerardus MANGNUS | 2022-02-08 |
| 11112703 | Method of metrology and associated apparatuses | Ruben Cornelis MAAS, Hermanus Adrianus DILLEN | 2021-09-07 |