JF

John A. Fitzsimmons

IBM: 84 patents #777 of 70,183Top 2%
Globalfoundries: 13 patents #279 of 4,424Top 7%
Infineon Technologies Ag: 5 patents #2,021 of 7,486Top 30%
AC Advanced Technology & Materials Co.: 1 patents #255 of 410Top 65%
IN Intermolecular: 1 patents #186 of 248Top 75%
GU Globalfoundries U.S.: 1 patents #344 of 665Top 55%
CM Chartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
GP Globalfoundries Singapore Pte.: 1 patents #427 of 828Top 55%
📍 Poughkeepsie, NY: #24 of 1,613 inventorsTop 2%
🗺 New York: #534 of 115,490 inventorsTop 1%
Overall (All Time): #14,271 of 4,157,543Top 1%
101
Patents All Time

Issued Patents All Time

Showing 1–25 of 101 patents

Patent #TitleCo-InventorsDate
10923427 SOI wafers with buried dielectric layers to prevent CU diffusion Anthony K. Stamper, Mukta G. Farooq 2021-02-16
10242947 SOI wafers with buried dielectric layers to prevent CU diffusion Anthony K. Stamper, Mukta G. Farooq 2019-03-26
10074562 Self aligned contact structure Rosa A. Orozco-Teran, Ravikumar Ramachandran, Russell H. Arndt, David L. Rath 2018-09-11
10037911 Device layer transfer with a preserved handle wafer section Anthony K. Stamper, Mukta G. Farooq, Mark D. Jaffe, Randy L. Wolf 2018-07-31
9966310 Integrated circuit structure having deep trench capacitor and through-silicon via and method of forming same Mukta G. Farooq, Anthony K. Stamper 2018-05-08
9929085 Integrated circuit structure having deep trench capacitor and through-silicon via and method of forming same Mukta G. Farooq, Anthony K. Stamper 2018-03-27
9892970 Integrated circuit structure having deep trench capacitor and through-silicon via and method of forming same Mukta G. Farooq, Anthony K. Stamper 2018-02-13
9852959 Corrosion resistant chip sidewall connection with crackstop and hermetic seal Michael J. Shapiro, Natalia Borjemscaia, Vincent J. McGahay 2017-12-26
9818637 Device layer transfer with a preserved handle wafer section Anthony K. Stamper, Mukta G. Farooq, Mark D. Jaffe, Randy L. Wolf 2017-11-14
9812404 Electrical connection around a crackstop structure Michael J. Shapiro, Natalia Borjemscaia 2017-11-07
9806025 SOI wafers with buried dielectric layers to prevent Cu diffusion Anthony K. Stamper, Mukta G. Farooq 2017-10-31
9671215 Wafer to wafer alignment Mukta G. Farooq, Spyridon Skordas 2017-06-06
9673176 Metal to metal bonding for stacked (3D) integrated circuits Tien-Jen Cheng, Mukta G. Farooq 2017-06-06
9666563 Metal to metal bonding for stacked (3D) integrated circuits Tien-Jen Cheng, Mukta G. Farooq 2017-05-30
9653432 Metal to metal bonding for stacked (3D) integrated circuits Tien-Jen Cheng, Mukta G. Farooq 2017-05-16
9653431 Metal to metal bonding for stacked (3D) integrated circuits Tien-Jen Cheng, Mukta G. Farooq 2017-05-16
9589806 Integrated circuit with replacement gate stacks and method of forming same Ruqiang Bao, Unoh Kwon, Huihang Dong 2017-03-07
9553054 Strain detection structures for bonded wafers and chips Mukta G. Farooq, Erdem Kaltalioglu, Wei Lin, Spyridon Skordas, Kevin R. Winstel 2017-01-24
9548244 Self-aligned contact structure Rosa A. Orozco-Teran, Ravikumar Ramachandran, Russell H. Arndt, David L. Rath 2017-01-17
9515051 Metal to metal bonding for stacked (3D) integrated circuits Tien-Jen Cheng, Mukta G. Farooq 2016-12-06
9461017 Electronic package that includes a plurality of integrated circuit devices bonded in a three-dimensional stack arrangement Mukta G. Farooq, Andrew H. Simon, Anthony K. Stamper 2016-10-04
9418865 Wet etching of silicon containing antireflective coatings Gregory Nowling 2016-08-16
9257336 Bottom-up plating of through-substrate vias Mukta G. Farooq, Troy L. Graves-Abe 2016-02-09
9252053 Self-aligned contact structure Rosa A. Orozco-Teran, Ravikumar Ramachandran, Russell H. Arndt, David L. Rath 2016-02-02
9153558 Electromigration immune through-substrate vias Ronald G. Filippi, Kevin Kolvenbach, Ping-Chuan Wang 2015-10-06