Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066391 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare | 2024-08-20 |
| 11906451 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare, Alok Vaid | 2024-02-20 |
| 11885737 | Method and system for optical characterization of patterned samples | Dror Shafir, Gilad Barak, Shay Wolfling, Michal Haim YACHINI, Matthew Sendelbach | 2024-01-30 |
| 11668663 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare | 2023-06-06 |
| 10943907 | Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry | Abhilasha Bhardwaj, Byeung Chul Kim, Michael E. Koltonski, Gurtej S. Sandhu, Matthew Thorum | 2021-03-09 |
| 10876959 | Method and system for optical characterization of patterned samples | Dror Shafir, Gilad Barak, Shay Wolfling, Michal Haim YACHINI, Matthew Sendelbach | 2020-12-29 |
| 10707211 | Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry | Abhilasha Bhardwaj, Byeung Chul Kim, Michael E. Koltonski, Gurtej S. Sandhu, Matthew Thorum | 2020-07-07 |
| 10534275 | Method for use in process control of manufacture of patterned sample | Aron Cepler, Paul ISBESTER | 2020-01-14 |
| 10533961 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare | 2020-01-14 |
| 10302414 | Scatterometry method and system | Gilad Wainreb, Etai Littwin, Alok Vaid, Michael Klots, Matthew Sendelbach | 2019-05-28 |
| 10209206 | Method and system for determining strain distribution in a sample | Gilad Barak, Shay Wolfling, Matthew Sendelbach | 2019-02-19 |
| 10197506 | Optical metrology for in-situ measurements | Igor Turovets, Dario Elyasi | 2019-02-05 |
| 10030971 | Measurement system and method for measuring in thin films | Alok Vaid, Sridhar Mahendrakar, Mainul Hossain, Taher Kagalwala | 2018-07-24 |
| 9915624 | Optical metrology for in-situ measurements | Igor Turovets, Dario Elyasi | 2018-03-13 |
| 9528946 | Optical metrology for in-situ measurements | Igor Turovets, Dario Elyasi | 2016-12-27 |