Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10664638 | Measuring complex structures in semiconductor fabrication | Taher Kagalwala, Matthew Sendelbach, Alok Vaid | 2020-05-26 |
| 10030971 | Measurement system and method for measuring in thin films | Cornel Bozdog, Alok Vaid, Mainul Hossain, Taher Kagalwala | 2018-07-24 |