Issued Patents All Time
Showing 26–50 of 60 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7649262 | Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing | Jonathan D. Chapple-Sokol, Terence B. Hook, Baozhen Li, Christopher A. Ponsolle, Bette B. Reuter +2 more | 2010-01-19 |
| 7585758 | Interconnect layers without electromigration | Stephen E. Luce, Anthony K. Stamper | 2009-09-08 |
| 7572650 | Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing | Jonathan D. Chapple-Sokol, Terence B. Hook, Baozhen Li, Christopher A. Ponsolle, Bette B. Reuter +2 more | 2009-08-11 |
| 7541679 | Exposed pore sealing post patterning | Edward C. Cooney, III, John A. Fitzsimmons, Jeffrey P. Gambino, Stephen E. Luce, Lee M. Nicholson +1 more | 2009-06-02 |
| 7538006 | Annular damascene vertical natural capacitor | Felix P. Anderson, Anthony K. Stamper | 2009-05-26 |
| 7521336 | Crack stop for low K dielectrics | Timothy H. Daubenspeck, Jeffrey P. Gambino, Stephen E. Luce, William T. Motsiff, Mark J. Pouliot +1 more | 2009-04-21 |
| 7375039 | Local plasma processing | Jeffrey P. Gambino, Anthony K. Stamper | 2008-05-20 |
| 7335577 | Crack stop for low K dielectrics | Timothy H. Daubenspeck, Jeffrey P. Gambino, Stephen E. Luce, William T. Motsiff, Mark J. Pouliot +1 more | 2008-02-26 |
| 7235487 | Metal seed layer deposition | Steven P. Barkyoumb, Jonathan D. Chapple-Sokol, Edward C. Cooney, III, Keith E. Downes, William J. Murphy | 2007-06-26 |
| 7223684 | Dual damascene wiring and method | Anthony K. Stamper | 2007-05-29 |
| 7183656 | Bilayer aluminum last metal for interconnects and wirebond pads | Stephen E. Luce, Anthony K. Stamper | 2007-02-27 |
| 7176119 | Method of fabricating copper damascene and dual damascene interconnect wiring | Jeffrey P. Gambino, William R. Hill, Kenneth F. McAvey, Jr., Anthony K. Stamper, Arthur C. Winslow +1 more | 2007-02-13 |
| 7173338 | Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing | Jonathan D. Chapple-Sokol, Terence B. Hook, Baozhen Li, Christopher A. Ponsolle, Bette B. Reuter +2 more | 2007-02-06 |
| 7087997 | Copper to aluminum interlayer interconnect using stud and via liner | Lloyd Burrell, Edward E. Cooney, III, Jeffrey P. Gambino, John E. Heidenreich, III, Hyun Koo Lee +6 more | 2006-08-08 |
| 7037824 | Copper to aluminum interlayer interconnect using stud and via liner | Lloyd Burrell, Edward E. Cooney, III, Jeffrey P. Gambino, John E. Heidenreich, III, Hyun Koo Lee +6 more | 2006-05-02 |
| 7015150 | Exposed pore sealing post patterning | Edward C. Cooney, III, John A. Fitzsimmons, Jeffrey P. Gambino, Stephen E. Luce, Lee M. Nicholson +1 more | 2006-03-21 |
| 6991971 | Method for fabricating a triple damascene fuse | Timothy H. Daubenspeck, William T. Motsiff, Anthony K. Stamper | 2006-01-31 |
| 6946379 | Insulative cap for laser fusing | Timothy H. Daubenspeck, William T. Motsiff, Henry A. Nye, III | 2005-09-20 |
| 6833720 | Electrical detection of dicing damage | Timothy H. Daubenspeck, Jeffrey P. Gambino, Anthony K. Stamper | 2004-12-21 |
| 6784516 | Insulative cap for laser fusing | Timothy H. Daubenspeck, William T. Motsiff, Henry A. Nye, III | 2004-08-31 |
| 6762108 | Method of forming a metal-insulator-metal capacitor for dual damascene interconnect processing and the device so formed | Jeffrey P. Gambino, Stephen E. Luce, Henry W. Trombley | 2004-07-13 |
| 6667533 | Triple damascene fuse | Timothy H. Daubenspeck, William T. Motsiff, Anthony K. Stamper | 2003-12-23 |
| 6653737 | Interconnection structure and method for fabricating same | David V. Horak, William A. Klaasen, Mark P. Murray, Anthony K. Stamper | 2003-11-25 |
| 6518643 | Tri-layer dielectric fuse cap for laser deletion | Anthony K. Stamper | 2003-02-11 |
| 6504203 | Method of forming a metal-insulator-metal capacitor for dual damascene interconnect processing and the device so formed | Jeffrey P. Gambino, Stephen E. Luce, Henry W. Trombley | 2003-01-07 |