Issued Patents All Time
Showing 151–175 of 186 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7482197 | Method and apparatus for deploying a liquid metal thermal interface for chip cooling | Bruce K. Furman, Yves Martin | 2009-01-27 |
| 7480429 | Chip to Chip optical interconnect | Punit P. Chiniwalla, Philip Charles Danby Hobbs | 2009-01-20 |
| 7469039 | Device and method for generating an x-ray point source by geometric confinement | Hendrik F. Hamann, Yves Martin, Hemantha K. Wickramasinghe | 2008-12-23 |
| 7440281 | Thermal interface apparatus | Sean Bailey, Richard Lidio Blanco, Jr., David L. Edwards, Supratik Guha, Michael D. Hillman +6 more | 2008-10-21 |
| 7344955 | Cut-and-paste imprint lithographic mold and method therefor | Matthew E. Colburn, Yves Martin, Hematha K. Wickramasinghe | 2008-03-18 |
| 7333188 | Method and apparatus for real-time measurement of trace metal concentration in chemical mechanical polishing (CMP) slurry | — | 2008-02-19 |
| 7288840 | Structure for cooling a surface | Bruce K. Furman, Yves Martin | 2007-10-30 |
| 7265977 | Active liquid metal thermal spreader | Yves Martin | 2007-09-04 |
| 7219713 | Heterogeneous thermal interface for cooling | Jeffrey D. Gelorme, Supratik Guha, Nancy C. LaBianca, Yves Martin | 2007-05-22 |
| 7186977 | Method for non-destructive trench depth measurement using electron beam source and X-ray detection | Yves Martin, Anthony Santiago | 2007-03-06 |
| 7130038 | Method and apparatus for optical film measurements in a controlled environment | Richard J. Lebel, Fredrik Maurer, Paul Smith, Hematha K. Wickramasinghe | 2006-10-31 |
| 7130379 | Device and method for generating an x-ray point source by geometric confinement | Hendrik F. Hamann, Yves Martin, Hemantha K. Wickramasinghe | 2006-10-31 |
| 7063127 | Method and apparatus for chip-cooling | Jeffrey D. Gelorme, Hendrik F. Hamann, Nancy C. LaBianca, Yves Martin | 2006-06-20 |
| 6967715 | Method and apparatus for optical film measurements in a controlled environment | Richard J. Lebel, Fredrik Maurer, Paul Smith, Hematha K. Wickramasinghe | 2005-11-22 |
| 6890388 | Apparatus and method for using an acoustic-jet for cleaning hard disk drive heads in manufacturing | Michael T. Prikas, Robert J. von Gutfeld, H. Kumar Wickramasinghe | 2005-05-10 |
| 6738142 | Integrated wafer cassette metrology assembly | Hematha K. Wickramasinghe, Richard J. Lebel | 2004-05-18 |
| 6579149 | Support and alignment device for enabling chemical mechanical polishing rinse and film measurements | Richard J. Lebel, Frederic Maurer, Rock Nadeau, Paul Smith, Hemantha K. Wickramasinghe | 2003-06-17 |
| 6567172 | System and multipass probe for optical interference measurements | Philip Charles Danby Hobbs, Richard J. Lebel, Martin P. O'Boyle, Hemantha K. Wickramasinghe | 2003-05-20 |
| 6458020 | Slurry recirculation in chemical mechanical polishing | Jeffrey A. Brigante, Thomas L. Conrad, David J. Fontaine, Rock Nadeau, Paul Smith | 2002-10-01 |
| 6352596 | Post CMP cleaning method using a brush cleaner with torque monitor | Gary J. Beardsley, Timothy Scott Bullard, Cuc K. Huynh, David Walker | 2002-03-05 |
| 6334807 | Chemical mechanical polishing in-situ end point system | Richard J. Lebel, Rock Nadeau, Martin P. O'Boyle, Paul Smith, Hemantha K. Wickramasinghe | 2002-01-01 |
| 6319093 | Chemical-mechanical polishing system and method for integrated spin dry-film thickness measurement | Richard J. Lebel, Frederic Maurer, Rock Nadeau, Paul Smith, Hemantha K. Wickramasinghe | 2001-11-20 |
| 6269510 | Post CMP clean brush with torque monitor | Gary J. Beardsley, Timothy Scott Bullard, Cuc K. Huynh, David Walker | 2001-08-07 |
| 6247368 | CMP wet application wafer sensor | Scott R. Cline, Willi O. Kalvaitis, Richard J. Lebel, Charles A. McKinney, Douglas P. Nadeau | 2001-06-19 |
| 6149498 | Semiconductor wafer handling system | Chris R. Whitaker | 2000-11-21 |