TY

Tenko Yamashita

IBM: 492 patents #21 of 70,183Top 1%
Globalfoundries: 118 patents #11 of 4,424Top 1%
TE Tessera: 5 patents #92 of 271Top 35%
CEA: 4 patents #1,058 of 7,956Top 15%
SO Sony: 4 patents #8,966 of 25,231Top 40%
ET Elpis Technologies: 3 patents #8 of 121Top 7%
RE Renesas Electronics: 3 patents #1,322 of 4,529Top 30%
AS Adeia Semiconductor Solutions: 2 patents #9 of 57Top 20%
SS Stmicroelectronics Sa: 2 patents #601 of 1,676Top 40%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
SF SUNY Research Foundation: 1 patents #469 of 1,165Top 45%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Schenectady, NY: #2 of 1,353 inventorsTop 1%
🗺 New York: #20 of 115,490 inventorsTop 1%
Overall (All Time): #309 of 4,157,543Top 1%
552
Patents All Time

Issued Patents All Time

Showing 526–550 of 552 patents

Patent #TitleCo-InventorsDate
8722494 Dual gate finFET devices Veeraraghavan S. Basker, Effendi Leobandung 2014-05-13
8723262 SOI FinFET with recessed merged fins and liner for enhanced stress coupling Veeraraghavan S. Basker, Huiming Bu, Effendi Leobandung, Theodorus E. Standaert, Chun-Chen Yeh 2014-05-13
8703553 MOS capacitors with a finFET process Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2014-04-22
8680644 Semiconductor device and method for making same Kangguo Cheng, Bruce B. Doris, Ying Zhang 2014-03-25
8679902 Stacked nanowire field effect transistor Veeraraghavan S. Basker, Chun-Chen Yeh 2014-03-25
8673735 Semiconductor device and method for making same Kangguo Cheng, Bruce B. Doris, Ying Zhang 2014-03-18
8673729 finFET eDRAM strap connection structure Veeraraghavan S. Basker, Effendi Leobandung, Chun-Chen Yeh 2014-03-18
8637384 FinFET parasitic capacitance reduction using air gap Takashi Ando, Josephine B. Chang, Sivananda K. Kanakasabapathy, Pranita Kulkarni, Theodorus E. Standaert 2014-01-28
8637930 FinFET parasitic capacitance reduction using air gap Takashi Ando, Josephine B. Chang, Sivananda K. Kanakasabapathy, Pranita Kulkarni, Theodorus E. Standaert 2014-01-28
8637931 finFET with merged fins and vertical silicide Veeraraghavan S. Basker, Andres Bryant, Huiming Bu, Wilfried E. Haensch, Effendi Leobandung +3 more 2014-01-28
8623712 Bulk fin-field effect transistors with well defined isolation Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2014-01-07
8604539 Bulk fin-field effect transistors with well defined isolation Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2013-12-10
8592263 FinFET diode with increased junction area Theodorus E. Standaert, Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth 2013-11-26
8592296 Gate-last fabrication of quarter-gap MGHK FET Takashi Ando, Kisik Choi, Vijay Narayanan, Junli Wang 2013-11-26
8592290 Cut-very-last dual-EPI flow Veeraraghavan S. Basker, Huiming Bu, Kangguo Cheng, Balasubramanian S. Haran, Nicolas Loubet +3 more 2013-11-26
8592264 Source-drain extension formation in replacement metal gate transistor device Takashi Ando, Huiming Bu, Ramachandra Divakaruni, Bruce B. Doris, Chung-Hsun Lin +1 more 2013-11-26
8581320 MOS capacitors with a finfet process Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2013-11-12
8569152 Cut-very-last dual-epi flow Veeraraghavan S. Basker, Huiming Bu, Kangguo Cheng, Balasubramanian S. Haran, Nicolas Loubet +3 more 2013-10-29
8569125 FinFET with improved gate planarity Theodorus E. Standaert, Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Soon-Cheon Seo 2013-10-29
8557657 Retrograde substrate for deep trench capacitors Veeraraghavan S. Basker, Wilfried E. Haensch, Effendi Leobandung, Chun-Chen Yeh 2013-10-15
8513073 Silicon germanium channel with silicon buffer regions for fin field effect transistor device Veeraraghavan S. Basker, Chun-Chun Yeh 2013-08-20
8455313 Method for fabricating finFET with merged fins and vertical silicide Veeraraghavan S. Basker, Andres Bryant, Huiming Bu, Wilfried E. Haensch, Effendi Leobandung +3 more 2013-06-04
8445334 SOI FinFET with recessed merged Fins and liner for enhanced stress coupling Veeraraghavan S. Basker, Huiming Bu, Effendi Leobandung, Theodorus E. Standaert, Chun-Chen Yeh 2013-05-21
8432002 Method and structure for low resistive source and drain regions in a replacement metal gate process flow Balasubramanian S. Haran, Kangguo Cheng, Shom Ponoth, Theodorus E. Standaert 2013-04-30
8420459 Bulk fin-field effect transistors with well defined isolation Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2013-04-16