TY

Tenko Yamashita

IBM: 492 patents #21 of 70,183Top 1%
Globalfoundries: 118 patents #11 of 4,424Top 1%
TE Tessera: 5 patents #92 of 271Top 35%
CEA: 4 patents #1,058 of 7,956Top 15%
SO Sony: 4 patents #8,966 of 25,231Top 40%
ET Elpis Technologies: 3 patents #8 of 121Top 7%
RE Renesas Electronics: 3 patents #1,322 of 4,529Top 30%
AS Adeia Semiconductor Solutions: 2 patents #9 of 57Top 20%
SS Stmicroelectronics Sa: 2 patents #601 of 1,676Top 40%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
SF SUNY Research Foundation: 1 patents #469 of 1,165Top 45%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Schenectady, NY: #2 of 1,353 inventorsTop 1%
🗺 New York: #20 of 115,490 inventorsTop 1%
Overall (All Time): #309 of 4,157,543Top 1%
552
Patents All Time

Issued Patents All Time

Showing 501–525 of 552 patents

Patent #TitleCo-InventorsDate
8932918 FinFET with self-aligned punchthrough stopper Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2015-01-13
8928067 Bulk fin-field effect transistors with well defined isolation Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2015-01-06
8927365 Method of eDRAM DT strap formation in FinFET device structure Veeraraghavan S. Basker, Sivananda K. Kanakasabapathy, Chun-Chen Yeb 2015-01-06
8912056 Dual epitaxial integration for FinFETS Veeraraghavan S. Basker, Effendi Leobandung, Xinhui Wang 2014-12-16
8912612 Silicon nitride gate encapsulation by implantation Veeraraghavan S. Basker, Sanjay C. Mehta, Chun-Chen Yeh 2014-12-16
8906759 Silicon nitride gate encapsulation by implantation Veeraraghavan S. Basker, Sanjay C. Mehta, Chun-Chen Yeh 2014-12-09
8900934 FinFET devices containing merged epitaxial Fin-containing contact regions Thomas N. Adam, Veeraraghavan S. Basker, Jinghong Li, Chung-Hsun Lin, Sebastian Naczas +1 more 2014-12-02
8896063 FinFET devices containing merged epitaxial Fin-containing contact regions Thomas N. Adam, Veeraraghavan S. Basker, Jinghong Li, Chung-Hsun Lin, Sebastian Naczas +1 more 2014-11-25
8889540 Stress memorization in RMG FinFets Veeraraghavan S. Basker, Qing Liu, Chun-Chen Yeh 2014-11-18
8883578 Strained silicon nFET and silicon germanium pFET on same wafer Veeraraghavan S. Basker, Chun-Chen Yeh 2014-11-11
8871626 FinFET with vertical silicide structure Veeraraghavan S. Basker, Chung-Hsun Lin, Chun-Chen Yeh 2014-10-28
8860107 FinFET-compatible metal-insulator-metal capacitor Wilfried E. Haensch, Pranita Kulkarni 2014-10-14
8860112 finFET eDRAM strap connection structure Veeraraghavan S. Basker, Effendi Leobandung, Chun-Chen Yeh 2014-10-14
8859379 Stress enhanced finFET devices Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2014-10-14
8841178 Strained silicon nFET and silicon germanium pFET on same wafer Veeraraghavan S. Basker, Chun-Chen Yeh 2014-09-23
8841716 Retrograde substrate for deep trench capacitors Veeraraghavan S. Basker, Wilfried E. Haensch, Effendi Leobandung, Chun-Chen Yeh 2014-09-23
8835249 Retrograde substrate for deep trench capacitors Veeraraghavan S. Basker, Wilfried E. Haensch, Effendi Leobandung, Chun-Chen Yeh 2014-09-16
8828828 MOSFET including asymmetric source and drain regions Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2014-09-09
8816420 MIM capacitor in finFET structure Veeraraghavan S. Basker, Effendi Leobandung, Chun-Chen Yeh 2014-08-26
8815661 MIM capacitor in FinFET structure Veeraraghavan S. Basker, Effendi Leobandung, Chun-Chen Yeh 2014-08-26
8815668 Preventing FIN erosion and limiting Epi overburden in FinFET structures by composite hardmask Veeraraghavan S. Basker, Effendi Leobandung, Chun-Chen Yeh 2014-08-26
8815670 Preventing Fin erosion and limiting EPI overburden in FinFET structures by composite hardmask Veeraraghavan S. Basker, Effendi Leobandung, Chun-Chen Yeh 2014-08-26
8816428 Multigate device isolation on bulk semiconductors Robert J. Miller, Hui Zang 2014-08-26
8786030 Gate-last fabrication of quarter-gap MGHK FET Takashi Ando, Kisik Choi, Vijay Narayanan, Junli Wang 2014-07-22
8772874 MOSFET including asymmetric source and drain regions Kangguo Cheng, Balasubramanian S. Haran, Shom Ponoth, Theodorus E. Standaert 2014-07-08