PP

Paul F. Petric

IBM: 12 patents #9,222 of 70,183Top 15%
KL Kla-Tencor: 8 patents #207 of 1,394Top 15%
VA Varian: 6 patents #36 of 684Top 6%
📍 Pleasanton, CA: #250 of 3,062 inventorsTop 9%
🗺 California: #20,738 of 386,348 inventorsTop 6%
Overall (All Time): #155,021 of 4,157,543Top 4%
26
Patents All Time

Issued Patents All Time

Showing 1–25 of 26 patents

Patent #TitleCo-InventorsDate
9715995 Apparatus and methods for electron beam lithography using array cathode Keith Standiford, Alan D. Brodie 2017-07-25
9355818 Reflection electron beam projection lithography using an ExB separator 2016-05-31
8957394 Compact high-voltage electron gun Alan D. Brodie, Joseph Maurino, Mark A. McCord 2015-02-17
8642981 Electron microscope assembly for viewing the wafer plane image of an electron beam lithography tool Mark A. McCord, Michael D. Madsen, Alan D. Brodie 2014-02-04
8373144 Quasi-annular reflective electron patterning device Mark A. McCord, Allen M. Carroll 2013-02-12
8253119 Well-based dynamic pattern generator Alan D. Brodie, Mark A. McCord 2012-08-28
7714287 Apparatus and method for obtaining topographical dark-field images in a scanning electron microscope Edward James, Ye Yang, Mark Lin, Alexander Jozef Gubbens 2010-05-11
6828571 Apparatus and methods of controlling surface charge and focus Mark A. McCord, Jan Lauber, Ross W. Thompson, Jason Lim, Frank Fan +1 more 2004-12-07
6262425 Curvilinear axis set-up for charged particle lithography Michael S. Gordon, Christopher F. Robinson, James D. Rockrohr 2001-07-17
6069684 Electron beam projection lithography system (EBPS) Steven D. Golladay, Hans C. Pfeiffer, Werner Stickel 2000-05-30
5793048 Curvilinear variable axis lens correction with shifted dipoles Guenther O. Langner 1998-08-11
5747814 Method for centering a lens in a charged-particle system Michael S. Gordon 1998-05-05
5650628 Simultaneous deflections in charged-particle beams Michael S. Gordon, Donald F. Haire, James D. Rockrohr 1997-07-22
5635719 Variable curvilinear axis deflection means for particle optical lenses 1997-06-03
5585629 Electron beam nano-metrology system Samuel K. Doran, William A. Enichen, Timothy R. Groves, Rodney A. Kendall, Henri A. Khoury +2 more 1996-12-17
5530251 Inductively coupled dual-stage magnetic deflection yoke 1996-06-25
5530252 Inductively coupled dual-stage magnetic deflection yoke 1996-06-25
5481164 Variable axis stigmator Guenther O. Langner 1996-01-02
5389858 Variable axis stigmator Guenther O. Langner 1995-02-14
5136167 Electron beam lens and deflection system for plural-level telecentric deflection Guenther O. Langner 1992-08-04
4607167 Charged particle beam lithography machine incorporating localized vacuum envelope 1986-08-19
4584479 Envelope apparatus for localized vacuum processing John R. Lamattina 1986-04-22
4560880 Apparatus for positioning a workpiece in a localized vacuum processing system Michael S. Foley, John J. Waz, Robert W. Milgate, III 1985-12-24
4528451 Gap control system for localized vacuum processing Michael S. Foley, Mark W. Utlaut, Joseph A. Laiacano 1985-07-09
4524261 Localized vacuum processing apparatus Michael S. Foley 1985-06-18