GL

Guenther O. Langner

IBM: 11 patents #9,995 of 70,183Top 15%
CD Control Data: 3 patents #6 of 192Top 4%
Overall (All Time): #357,520 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5793048 Curvilinear variable axis lens correction with shifted dipoles Paul F. Petric 1998-08-11
5757010 Curvilinear variable axis lens correction with centered dipoles 1998-05-26
5708274 Curvilinear variable axis lens correction with crossed coils Werner Stickel 1998-01-13
5481164 Variable axis stigmator Paul F. Petric 1996-01-02
5389858 Variable axis stigmator Paul F. Petric 1995-02-14
5301124 Registration of patterns formed of multiple fields Ken Chan, Donald E. Davis, William A. Enichen, Cecil T. Ho, Edward V. Weber 1994-04-05
5285074 Dynamic compensation of non-linear electron beam landing angle in variable axis lenses Don F. Haire, Cecil T. Ho, Werner Stickel, Edward V. Weber 1994-02-08
5136167 Electron beam lens and deflection system for plural-level telecentric deflection Paul F. Petric 1992-08-04
4820927 Electron beam source employing a photo-emitter cathode Kenneth J. Harte 1989-04-11
4683366 All electrostatic electron optical sub-system for variable electron beam spot shaping and method of operation Kenneth J. Harte 1987-07-28
4675528 Method for measurement of spotsize and edgewidth in electron beam lithography Kenneth J. Harte, Michael Dalterio, Marvin Fishbein 1987-06-23
4468565 Automatic focus and deflection correction in E-beam system using optical target height measurements William Blair, Samuel K. Doran 1984-08-28
4415851 System for contactless testing of multi-layer ceramics Hans C. Pfeiffer 1983-11-15
4376249 Variable axis electron beam projection system Hans C. Pfeiffer, Maris A. Sturans 1983-03-08