Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4675528 | Method for measurement of spotsize and edgewidth in electron beam lithography | Guenther O. Langner, Kenneth J. Harte, Michael Dalterio | 1987-06-23 |
| 4338548 | Unipotential lens assembly for charged particle beam tubes and method for applying correction potentials thereto | David Bono, Kenneth J. Harte | 1982-07-06 |