RK

Rodney A. Kendall

IBM: 20 patents #5,451 of 70,183Top 8%
NI Nikon: 8 patents #523 of 2,493Top 25%
Overall (All Time): #140,112 of 4,157,543Top 4%
28
Patents All Time

Issued Patents All Time

Showing 25 most recent of 28 patents

Patent #TitleCo-InventorsDate
6908255 Remote clamping mechanism via vacuum feedthrough Lonn E. Moore, David J. Pinckney, Richard Rieland 2005-06-21
6818906 Electron beam position reference system John G. Hartley, David J. Pinckney, Richard Rieland 2004-11-16
6724001 Electron beam lithography apparatus with self actuated vacuum bypass valve David J. Pinckney 2004-04-20
6639219 Electron scatter in a thin membrane to eliminate detector saturation Christopher F. Robinson 2003-10-28
6596999 High performance source for electron beam projection lithography Steven D. Golladay, Michael S. Gordon, Shinichi Kojima, Werner Stickel 2003-07-22
6588090 Fabrication method of high precision, thermally stable electromagnetic coil vanes David A. Pickney 2003-07-08
6483117 Symmetric blanking for high stability in electron beam exposure systems Clay S. Clement, Michael S. Gordon, Werner Stickel 2002-11-19
6437347 Target locking system for electron beam lithography John G. Hartley 2002-08-20
6414313 Multiple numerical aperture electron beam projection lithography system Michael S. Gordon, David J. Pinckney 2002-07-02
6369396 Calibration target for electron beams John G. Hartley, Timothy R. Groves, Maris A. Sturans 2002-04-09
6353231 Pinhole detector for electron intensity distribution Steven D. Golladay, Michael S. Gordon, Carl E. Bohnenkamp 2002-03-05
6252339 Removable bombardment filament-module for electron beam projection systems 2001-06-26
6246053 Non-contact autofocus height detector for lithography systems Gary J. Johnson, David J. Pinckney 2001-06-12
6175122 Method for writing a pattern using multiple variable shaped electron beams Timothy R. Groves 2001-01-16
6153885 Toroidal charged particle deflector with high mechanical stability and accuracy 2000-11-28
6091187 High emittance electron source having high illumination uniformity Steven D. Golladay, Carl E. Bohnenkamp 2000-07-18
6053241 Cooling method and apparatus for charged particle lenses and deflectors 2000-04-25
6028662 Adjustment of particle beam landing angle Maris A. Sturans 2000-02-22
5981962 Distributed direct write lithography system using multiple variable shaped electron beams Timothy R. Groves 1999-11-09
5962859 Multiple variable shaped electron beam system with lithographic structure Timothy R. Groves 1999-10-05
5742065 Heater for membrane mask in an electron-beam lithography system Michael S. Gordon, David J. Pinckney, James L. Speidell 1998-04-21
5585629 Electron beam nano-metrology system Samuel K. Doran, William A. Enichen, Timothy R. Groves, Henri A. Khoury, Richard D. Moore +2 more 1996-12-17
5532903 Membrane electrostatic chuck 1996-07-02
5508518 Lithography tool with vibration isolation 1996-04-16
5434424 Spinning reticle scanning projection lithography exposure system and method Werner Stickel 1995-07-18