Issued Patents All Time
Showing 2,551–2,575 of 2,819 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8546228 | Strained thin body CMOS device having vertically raised source/drain stressors with single spacer | Bruce B. Doris, Ali Khakifirooz, Pranita Kulkarni, Ghavam G. Shahidi | 2013-10-01 |
| 8546209 | Replacement metal gate processing with reduced interlevel dielectric layer etch rate | Junli Wang, Keith Kwong Hon Wong, Chih-Chao Yang | 2013-10-01 |
| 8541274 | Methods of forming 3-D semiconductor devices with a nanowire gate structure wherein the nanowire gate structure is formed after source/drain formation | Ruilong Xie, Xiuyu Cai, Ali Khakifirooz | 2013-09-24 |
| 8536632 | FinFET with reduced gate to fin overlay sensitivity | Louis L. Hsu, Jack A. Mandelman, John E. Sheets, II | 2013-09-17 |
| 8536650 | Strained ultra-thin SOI transistor formed by replacement gate | Junedong Lee | 2013-09-17 |
| 8536032 | Formation of embedded stressor through ion implantation | Bruce B. Doris, Ali Khakifirooz, Pranita Kulkarni, Ghavam G. Shahidi | 2013-09-17 |
| 8530974 | CMOS structure having multiple threshold voltage devices | Bruce B. Doris, Ali Khakifirooz, Pranita Kulkarni | 2013-09-10 |
| 8530971 | Borderless contacts for semiconductor devices | Bruce B. Doris, Keith Kwong Hon Wong | 2013-09-10 |
| 8525186 | Method of forming a planar field effect transistor with embedded and faceted source/drain stressors on a silicon-on-insulator (SOI) wafer, a planar field effect transistor structure and a design structure for the planar field effect transistor | Johnathan E. Faltermeier, Toshiharu Furukawa, Xuefeng Hua | 2013-09-03 |
| 8525292 | SOI device with DTI and STI | Bruce B. Doris, Ali Khakifirooz, Pranita Kulkarni | 2013-09-03 |
| 8525263 | Programmable high-k/metal gate memory device | Roger A. Booth, Jr., Chandrasekharan Kothandaraman, Chengwen Pei | 2013-09-03 |
| 8524592 | Methods of forming semiconductor devices with self-aligned contacts and low-k spacers and the resulting devices | Ruilong Xie, Xiuyu Cai, Ali Khakifirooz | 2013-09-03 |
| 8525235 | Multiplying pattern density by single sidewall imaging transfer | Bruce B. Doris, Ying Zhang | 2013-09-03 |
| 8518767 | FinFET with reduced gate to fin overlay sensitivity | Louis L. Hsu, Jack A. Mandelman, John E. Sheets, II | 2013-08-27 |
| 8513765 | Formation method and structure for a well-controlled metallic source/drain semiconductor device | Bruce B. Doris, Ali Khakifirooz, Ghavam G. Shahidi | 2013-08-20 |
| 8513723 | Method and structure for forming high performance MOS capacitor along with fully depleted semiconductor on insulator devices on the same chip | Roger A. Booth, Jr., Bruce B. Doris, Ghavam G. Shahidi | 2013-08-20 |
| 8507354 | On-chip capacitors in combination with CMOS devices on extremely thin semiconductor on insulator (ETSOI) substrates | Thomas N. Adam, Ali Khakifirooz, Alexander Reznieck | 2013-08-13 |
| 8507989 | Extremely thin semiconductor-on-insulator (ETSOI) FET with a back gate and reduced parasitic capacitance | Ali Khakifirooz, Bruce B. Doris | 2013-08-13 |
| 8492839 | Same-chip multicharacteristic semiconductor structures | Bruce B. Doris, Ali Khakifirooz, Pranita Kulkarni, Ghavam G. Shahidi | 2013-07-23 |
| 8492821 | Enhanced capacitance trench capacitor | Byeong Y. Kim, Munir D. Naeem, James P. Norum | 2013-07-23 |
| 8492817 | Highly scalable trench capacitor | Anne Marie Ebert, Johnathan E. Faltermeier | 2013-07-23 |
| 8492811 | Self-aligned strap for embedded capacitor and replacement gate devices | Roger A. Booth, Jr., Joseph Ervin, Chengwen Pei, Geng Wang | 2013-07-23 |
| 8492241 | Method for simultaneously forming a through silicon via and a deep trench structure | Mukta G. Farooq, Louis L. Hsu | 2013-07-23 |
| 8492854 | Integrated circuit having raised source drains devices with reduced silicide contact resistance and methods to fabricate same | Bruce B. Doris, Ali Khakifirooz, Pranita Kulkarni, Christian Lavoie | 2013-07-23 |
| 8486776 | Strained devices, methods of manufacture and design structures | Stephen W. Bedell, Bruce B. Doris, Ali Khakifirooz, Pranita Kulkarni, Katherine L. Saenger | 2013-07-16 |