Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8383483 | High performance CMOS circuits, and methods for fabricating same | John C. Arnold, Alessandro C. Callegari, Tze-Chiang Chen, Michael P. Chudzik, Bruce B. Doris +7 more | 2013-02-26 |
| 8178433 | Methods for the formation of fully silicided metal gates | Michelle L. Steen | 2012-05-15 |
| 7705405 | Methods for the formation of fully silicided metal gates | Michelle L. Steen | 2010-04-27 |
| 7473975 | Fully silicided metal gate semiconductor device structure | Ghavam G. Shahidi, Michelle L. Steen | 2009-01-06 |
| 7273777 | Formation of fully silicided (FUSI) gate using a dual silicide process | Ghavam G. Shahidi, Michelle L. Steen | 2007-09-25 |
| 7135398 | Reliable low-k interconnect structure with hybrid dielectric | John A. Fitzsimmons, Stephen E. Greco, Jia Lee, Stephen M. Gates, Terry A. Spooner +3 more | 2006-11-14 |
| 7034400 | Dual damascene interconnect structure using low stress fluorosilicate insulator with copper conductors | Edward Barth, Jeffrey P. Gambino, Thomas Ivers, Hyun Koo Lee, Ernest N. Levine +2 more | 2006-04-25 |
| 6933191 | Two-mask process for metal-insulator-metal capacitors and single mask process for thin film resistors | Zheng Chen, Timothy J. Dalton, Naftali E. Lustig | 2005-08-23 |
| 6917108 | Reliable low-k interconnect structure with hybrid dielectric | John A. Fitzsimmons, Stephen E. Greco, Jia Lee, Stephen M. Gates, Terry A. Spooner +3 more | 2005-07-12 |
| 6597067 | Self-aligned, lateral diffusion barrier in metal lines to eliminate electromigration | Daniel M. Boyne, Hormazdyar M. Dalal, H. Daniel Schnurmann | 2003-07-22 |
| 5952674 | Topography monitor | Daniel C. Edelstein | 1999-09-14 |
| 5563517 | Dual channel d.c. low noise measurement system and test methodology | Daniel M. Boyne, Kenneth P. Rodbell, Richard G. Smith, Michael H. Wood | 1996-10-08 |
| 5470788 | Method of making self-aligned, lateral diffusion barrier in metal lines to eliminate electromigration | Daniel M. Boyne, Hormazdyar M. Dalal | 1995-11-28 |
| 5434385 | Dual channel D.C. low noise measurement system and test methodology | Daniel M. Boyne, Kenneth P. Rodbell, Richard G. Smith, Michael H. Wood | 1995-07-18 |