Issued Patents All Time
Showing 26–50 of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7553334 | Defective product inspection apparatus, probe positioning method and probe moving method | Eiichi Hazaki, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato, Osamu Satou +2 more | 2009-06-30 |
| 7550750 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2009-06-23 |
| 7506608 | Hinge mechanism | Hitoshi Sato, Minoru Ohiraki, Sakae Higano | 2009-03-24 |
| 7470918 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2008-12-30 |
| 7465945 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2008-12-16 |
| 7346375 | Rotating mechanism of biaxial hinge and portable telephone with the same | Hitoshi Sato, Sakae Higano, Satoshi Kosugi, Katsumasa Yamaguchi, Kenichi Sakamoto | 2008-03-18 |
| 7297945 | Defective product inspection apparatus, probe positioning method and probe moving method | Eiichi Hazaki, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato, Osamu Satou +2 more | 2007-11-20 |
| 7222235 | Image processing system utilizing digital watermarks in predetermined regions | — | 2007-05-22 |
| 7205554 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2007-04-17 |
| 7205560 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2007-04-17 |
| 7130063 | Micropattern shape measuring system and method | Yasutsugu Usami, Isao Kawata, Yuya Toyoshima, Tadashi Otaka, Nobuyuki Iriki | 2006-10-31 |
| 7038767 | Three-dimensional micropattern profile measuring system and method | Yuya Toyoshima, Yasutsugu Usami, Isao Kawata, Tadashi Otaka | 2006-05-02 |
| 6927391 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2005-08-09 |
| 6894790 | Micropattern shape measuring system and method | Yasutsugu Usami, Isao Kawata, Yuya Toyoshima, Tadashi Otaka, Nobuyuki Iriki | 2005-05-17 |
| 6881597 | Method of manufacturing a semiconductor device to provide a plurality of test element groups (TEGs) in a scribe region | Kyoichiro Asayama, Fumiko Arakawa, Shiro Kamohara, Yuzuru Ohji | 2005-04-19 |
| 6781125 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2004-08-24 |
| 6120227 | Self-aligning bolt | Yoshihiro Murase, Yoshiyasu Ito | 2000-09-19 |
| 6051834 | Electron microscope | Hiroshi Kakibayashi, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji +7 more | 2000-04-18 |
| 5877498 | Method and apparatus for X-ray analyses | Aritoshi Sugimoto, Yoshimi Sudo, Tokuo Kure, Ken Ninomiya, Katsuhiro Kuroda +3 more | 1999-03-02 |
| 5866905 | Electron microscope | Hiroshi Kakibayashi, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji +7 more | 1999-02-02 |
| 5744800 | Defect observing electron microscope | Hiroshi Kakibayashi, Hisaya Murakoshi, Hidekazu Okuhira, Takashi Irie, Jiro Tokita +1 more | 1998-04-28 |
| RE35681 | Atmospheric pressure ionization mass spectrometer | Osami Okada | 1997-12-02 |
| 5594246 | Method and apparatus for x-ray analyses | Yoshimi Sudo, Tokuo Kure, Ken Ninomiya, Katsuhiro Kuroda, Takashi Nishida +2 more | 1997-01-14 |
| 5552602 | Electron microscope | Hiroshi Kakibayashi, Hideo Tadokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji +3 more | 1996-09-03 |
| 5485016 | Atmospheric pressure ionization mass spectrometer | Takashi Irie, Kazuaki Mizokami, Katsumi Kuriyama | 1996-01-16 |