DW

Derick J. Wristers

AM AMD: 151 patents #11 of 9,279Top 1%
🗺 Texas: #176 of 125,132 inventorsTop 1%
Overall (All Time): #6,064 of 4,157,543Top 1%
152
Patents All Time

Issued Patents All Time

Showing 51–75 of 152 patents

Patent #TitleCo-InventorsDate
6242330 Process for breaking silicide stringers extending between silicide areas of different active regions Jon D. Cheek, Fred N. Hause 2001-06-05
6225188 Self aligned method for differential oxidation rate at shallow trench isolation edge H. Jim Fulford, Mark I. Gardner 2001-05-01
6225151 Nitrogen liner beneath transistor source/drain regions to retard dopant diffusion Mark I. Gardner, Robert Dawson, H. Jim Fulford, Frederick N. Hause, Daniel Kadosh +2 more 2001-05-01
6204148 Method of making a semiconductor device having a grown polysilicon layer Mark I. Gardner, H. Jim Fulford 2001-03-20
6201278 Trench transistor with insulative spacers Mark I. Gardner, Robert Dawson, H. Jim Fulford, Frederick N. Hause, Mark W. Michael +1 more 2001-03-13
6197645 Method of making an IGFET with elevated source/drain regions in close proximity to gate with sloped sidewalls Mark W. Michael, Robert Dawson, H. Jim Fulford, Mark I. Gardner, Frederick N. Hause +1 more 2001-03-06
6188114 Method of forming an insulated-gate field-effect transistor with metal spacers Mark I. Gardner, Robert Dawson, H. Jim Fulford, Frederick N. Hause, Mark W. Michael +1 more 2001-02-13
6188107 High performance transistor fabricated on a dielectric film and method of making same Mark I. Gardner, Frederick N. Hause 2001-02-13
6187620 Integrated circuit having sacrificial spacers for producing graded NMOS source/drain junctions possibly dissimilar from PMOS source/drain junctions H. Jim Fulford, Mark I. Gardner 2001-02-13
6180475 Transistor formation with local interconnect overetch immunity Jon D. Cheek, H. Jim Fulford 2001-01-30
6166354 System and apparatus for in situ monitoring and control of annealing in semiconductor fabrication Frederick N. Hause, Robert Dawson, H. Jim Fulford, Mark I. Gardner, Mark W. Michael +1 more 2000-12-26
6162694 Method of forming a metal gate electrode using replaced polysilicon structure Jon D. Cheek, Mark I. Gardner 2000-12-19
6162688 Method of fabricating a transistor with a dielectric underlayer and device incorporating same Mark I. Gardner, H. Jim Fulford 2000-12-19
6160300 Multi-layer gate conductor having a diffusion barrier in the bottom layer Mark I. Gardner, Charles E. May 2000-12-12
6159812 Reduced boron diffusion by use of a pre-anneal Jon D. Cheek, William A. Whigham 2000-12-12
6150695 Multilevel transistor formation employing a local substrate formed within a shallow trench Mark I. Gardner, Daniel Kadosh 2000-11-21
6146978 Integrated circuit having an interlevel interconnect coupled to a source/drain region(s) with source/drain region(s) boundary overlap and reduced parasitic capacitance Mark W. Michael, Robert Dawson, H. Jim Fulford, Mark I. Gardner, Frederick N. Hause +1 more 2000-11-14
6124610 Isotropically etching sidewall spacers to be used for both an NMOS source/drain implant and a PMOS LDD implant Jon D. Cheek, Anthony J. Toprac 2000-09-26
6118163 Transistor with integrated poly/metal gate electrode Mark I. Gardner, Jon D. Cheek 2000-09-12
6114211 Semiconductor device with vertical halo region and methods of manufacture H. Jim Fulford, Jon D. Cheek, James F. Buller 2000-09-05
6111260 Method and apparatus for in situ anneal during ion implant Robert Dawson, H. Jim Fulford, Mark I. Gardner, Frederick N. Hause, Mark W. Michael +1 more 2000-08-29
6107130 CMOS integrated circuit having a sacrificial metal spacer for producing graded NMOS source/drain junctions dissimilar from PMOS source/drain junctions H. Jim Fulford, Mark I. Gardner 2000-08-22
6104063 Multiple spacer formation/removal technique for forming a graded junction H. Jim Fulford, Mark I. Gardner 2000-08-15
6104077 Semiconductor device having gate electrode with a sidewall air gap Mark I. Gardner, Jon D. Cheek 2000-08-15
6103559 Method of making disposable channel masking for both source/drain and LDD implant and subsequent gate fabrication Mark I. Gardner, H. Jim Fulford 2000-08-15