BP

Balasubramanian Pranatharthiharan

IBM: 37 patents #50 of 10,852Top 1%
Globalfoundries: 15 patents #19 of 1,311Top 2%
SS Stmicroelectronics Sa: 1 patents #48 of 135Top 40%
🗺 California: #73 of 60,394 inventorsTop 1%
Overall (2017): #319 of 506,227Top 1%
40
Patents 2017

Issued Patents 2017

Showing 26–40 of 40 patents

Patent #TitleCo-InventorsDate
9627322 Semiconductor device having reduced contact resistance Injo Ok, Charan V. Surisetty 2017-04-18
9620622 Replacement metal gate dielectric cap Damon B. Farmer, Michael A. Guillorn, George S. Tulevski 2017-04-11
9614047 Gate contact with vertical isolation from source-drain David V. Horak, Shom Ponoth, Ruilong Xie 2017-04-04
9595578 Undercut insulating regions for silicon-on-insulator device Kangguo Cheng, Bruce B. Doris, Shom Ponoth, Theodorus E. Standaert, Tenko Yamashita 2017-03-14
9595592 Forming dual contact silicide using metal multi-layer and ion beam mixing Injo Ok, Soon-Cheon Seo, Charan V. Surisetty 2017-03-14
9590074 Method to prevent lateral epitaxial growth in semiconductor devices Hui Zang 2017-03-07
9583489 Solid state diffusion doping for bulk finFET devices Brent A. Anderson, Hemanth Jagannathan, Sanjay C. Mehta 2017-02-28
9576961 Semiconductor devices with sidewall spacers of equal thickness Kangguo Cheng, Soon-Cheon Seo 2017-02-21
9576957 Self-aligned source/drain contacts Praneet Adusumilli, Emre Alptekin, Kangguo Cheng, Shom Ponoth 2017-02-21
9576954 POC process flow for conformal recess fill Andrew M. Greene, Sanjay C. Mehta, Ruilong Xie 2017-02-21
9570555 Source and drain epitaxial semiconductor material integration for high voltage semiconductor devices Junli Wang, Ruilong Xie 2017-02-14
9564370 Effective device formation for advanced technology nodes with aggressive fin-pitch scaling Injo Ok, Sanjay C. Mehta, Soon-Cheon Seo, Charan V. Surisetty 2017-02-07
9564372 Dual liner silicide Ruilong Xie, Chun-Chen Yeh 2017-02-07
9558995 HDP fill with reduced void formation and spacer damage Huiming Bu, Andrew M. Greene, Ruilong Xie 2017-01-31
9536988 Parasitic capacitance reduction Junli Wang 2017-01-03