HY

Hideyuki Yamamoto

HI Hitachi: 10 patents #7 of 3,771Top 1%
HH Hitachi High-Technologies: 4 patents #2 of 77Top 3%
TT Trecenti Technologies: 1 patents #1 of 5Top 20%
Overall (2004): #772 of 270,089Top 1%
13
Patents 2004

Issued Patents 2004

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
6830649 Apparatus and method for producing semiconductors Akira Kagoshima, Yoshimi Torii, Tatehito Usui 2004-12-14
6828165 Semiconductor plasma processing apparatus with first and second processing state monitoring units Junichi Tanaka, Hiroyuki Kitsunai, Akira Kagoshima, Daisuke Shiraishi, Shoji Ikuhara +1 more 2004-12-07
6825617 Semiconductor processing apparatus Seiichiro Kanno, Ryoji Nishio, Ken Yoshioka, Saburou Kanai, Hideki Kihara 2004-11-30
6796269 Apparatus and method for monitoring plasma processing apparatus Ichiro Sasaki, Toshio Masuda, Muneo Furuse 2004-09-28
6776872 Data processing apparatus for semiconductor processing apparatus Junichi Tanaka, Toshio Masuda, Akira Kagoshima, Shoji Ikuhara 2004-08-17
6771481 Plasma processing apparatus for processing semiconductor wafer using plasma Ryoji Nishio, Seiichiro Kanno, Akira Kagoshima 2004-08-03
6755932 Plasma processing system and apparatus and a sample processing method Toshio Masuda, Tatehito Usui, Mitsuru Suehiro, Hiroshi Kanekiyo, Kazue Takahashi +1 more 2004-06-29
6747239 Plasma processing apparatus and method Junichi Tanaka, Hiroyuki Kitsunai, Ryoji Nishio, Seiichiro Kanno 2004-06-08
6745096 Maintenance method and system for plasma processing apparatus etching and apparatus Toshio Masuda, Shoji Ikuhara, Akira Kagoshima, Junichi Tanaka 2004-06-01
6733618 Disturbance-free, recipe-controlled plasma processing system and method Akira Kagoshima, Shoji Ikuhara, Toshio Masuda, Hiroyuki Kitsunai, Junichi Tanaka +2 more 2004-05-11
6716301 Semiconductor manufacturing apparatus and method of processing semiconductor wafer using plasma, and wafer voltage probe Seiichiro Kanno, Ryoji Nishio, Tsutomu Tetsuka, Junichi Tanaka, Kazuyuki Ikenaga +1 more 2004-04-06
6706543 Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a therefor Junichi Tanaka, Hiroyuki Kitsunai, Akira Kagoshima, Daisuke Shiraishi, Shoji Ikuhara +1 more 2004-03-16
6700090 Plasma processing method and plasma processing apparatus Tetsuo Ono, Katsumi Setoguchi 2004-03-02