CU

Cyprian Emeka Uzoh

IBM: 13 patents #39 of 5,400Top 1%
NU Nutool: 9 patents #2 of 9Top 25%
📍 San Jose, CA: #3 of 2,494 inventorsTop 1%
🗺 California: #32 of 26,763 inventorsTop 1%
Overall (2002): #203 of 266,432Top 1%
22
Patents 2002

Issued Patents 2002

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
6497800 Device providing electrical contact to the surface of a semiconductor workpiece during metal plating Homayoun Talieh, Bulent M. Basol 2002-12-24
6492262 Process and structure for an interlock and high performance multilevel structures for chip interconnects and packaging technologies 2002-12-10
6482307 Method of and apparatus for making electrical contact to wafer surface for full-face electroplating or electropolishing Jalal Ashjaee, Boguslaw Nagorski, Bulent M. Basol, Homayoun Talieh 2002-11-19
6478936 Anode assembly for plating and planarizing a conductive layer Rimma Volodarsky, Konstantin Volodarsky, Homayoun Talieh, Douglas W. Young 2002-11-12
6465376 Method and structure for improving electromigration of chip interconnects Daniel C. Edelstein, Andrew H. Simon 2002-10-15
6437440 Thin film metal barrier for electrical interconnections Cyril Cabral, Jr., Patrick W. DeHaven, Daniel C. Edelstein, David P. Klaus, James Manley Pollard, III +1 more 2002-08-20
6429519 Wiring structures containing interconnected metal and wiring levels including a continuous, single crystalline or polycrystalline conductive material having one or more twin boundaries 2002-08-06
6413403 Method and apparatus employing pad designs and structures with improved fluid distribution Paul Lindquist, Bulent M. Basol, Homayoun Talieh 2002-07-02
6413854 Method to build multi level structure Daniel C. Edelstein, Cheryl G. Faltermeier, Peter S. Locke 2002-07-02
6413388 Pad designs and structures for a versatile materials processing apparatus Bulent M. Basol, Homayoun Talieh 2002-07-02
6409904 Method and apparatus for depositing and controlling the texture of a thin film Homayoun Talieh 2002-06-25
6406608 Apparatus to monitor and add plating solution to plating baths and controlling quality of deposited metal Wilma Jean Horkans, Panayotis Andricacos 2002-06-18
6399496 Copper interconnection structure incorporating a metal seed layer Daniel C. Edelstein, James M. E. Harper, Chao-Kun Hu, Andrew H. Simon 2002-06-04
6380628 Microstructure liner having improved adhesion John A. Miller, Andrew H. Simon, Jill Slattery, Yun-Yu Wang 2002-04-30
6372081 Process to prevent copper contamination of semiconductor fabs L. Paivikki Buchwalter 2002-04-16
6355153 Chip interconnect and packaging deposition methods and structures Homayoun Talieh, Bulent M. Basol 2002-03-12
6354916 Modified plating solution for plating and planarization and process utilizing same Bulent M. Basol, Homayoun Talieh 2002-03-12
6352623 Vertically configured chamber used for multiple processes Konstantin Volodarsky, Boguslaw Nagorski, Rimma Volodarsky, Douglas W. Young, Homayoun Talieh 2002-03-05
6344129 Method for plating copper conductors and devices formed Kenneth P. Rodbell, Panayotis Andricacos, Cyril Cabral, Jr., Lynne M. Gignac, Peter S. Locke 2002-02-05
6339258 Low resistivity tantalum Edward C. Cooney, III 2002-01-15
6337218 Method to test devices on high performance ULSI wafers Stephen A. Cohen, Arnold Halperin 2002-01-08
6337151 Graded composition diffusion barriers for chip wiring applications Daniel C. Edelstein, Andrew H. Simon 2002-01-08