SL

Shifang Li

TL Tokyo Electron Limited: 31 patents #121 of 5,567Top 3%
General Motors: 30 patents #353 of 18,328Top 2%
KL Kla-Tencor: 13 patents #103 of 1,394Top 8%
TT Timbre Technologies: 12 patents #6 of 39Top 20%
OC Oplink Communications: 5 patents #14 of 109Top 15%
KL Kla: 3 patents #125 of 758Top 20%
Applied Materials: 2 patents #3,641 of 7,310Top 50%
NI Nanometrics Incorporated: 1 patents #69 of 127Top 55%
TI Transamerican Technologies International: 1 patents #3 of 4Top 75%
📍 Pleasanton, CA: #27 of 3,062 inventorsTop 1%
🗺 California: #2,242 of 386,348 inventorsTop 1%
Overall (All Time): #14,436 of 4,157,543Top 1%
100
Patents All Time

Issued Patents All Time

Showing 76–100 of 100 patents

Patent #TitleCo-InventorsDate
7515282 Modeling and measuring structures with spatially varying properties in optical metrology Vi Vuong, Alan Nolet, Junwei Bao 2009-04-07
7511835 Optical metrology using a support vector machine with simulated diffraction signal inputs Wen Jin, Junwei Bao 2009-03-31
7483809 Optical metrology using support vector machine with profile parameter inputs Wen Jin, Junwei Bao 2009-01-27
7480062 Automated process control using parameters determined from a photomask covered by a pellicle Sanjay K. Yedur, Manuel Madriaga 2009-01-20
7474420 In-die optical metrology Junwei Bao, Vi Vuong 2009-01-06
7453584 Examining a structure formed on a semiconductor wafer using machine learning systems Junwei Bao 2008-11-18
7450232 Generic interface for an optical metrology system Junwei Bao, Nickhil Jakatdar, Xinhui Niu 2008-11-11
7428060 Optimization of diffraction order selection for two-dimensional structures Wen Jin, Srinivas Doddi 2008-09-23
7414733 Azimuthal scanning of a structure formed on a semiconductor wafer Joerg Bischoff, Xinhui Niu 2008-08-19
7394535 Optical metrology using a photonic nanojet Zhigang Chen, Hanyou Chu 2008-07-01
7372583 Controlling a fabrication tool using support vector machine Wen Jin, Junwei Bao, Manuel Madriaga 2008-05-13
7355728 Optical metrology model optimization for repetitive structures Junwei Bao, Hong Qui, Victor Kai Liu 2008-04-08
7302367 Library accuracy enhancement and evaluation Junwei Bao, Wei Liu 2007-11-27
7280229 Examining a structure formed on a semiconductor wafer using machine learning systems Junwei Bao 2007-10-09
7271902 Generic interface for an optical metrology system Junwei Bao, Nickhil Jakatdar, Xinhui Niu 2007-09-18
7224471 Azimuthal scanning of a structure formed on a semiconductor wafer Joerg Bischoff, Xinhui Niu 2007-05-29
7064829 Generic interface for an optical metrology system Junwei Bao, Nickhil Jakatdar, Xinhui Niu 2006-06-20
7035497 Miniature 1×2 magneto-optic switch Qing Shao 2006-04-25
6944363 Miniature magneto-optic fiber optical switch Qing Shao 2005-09-13
6895129 Optical circulator Zhimin Liu, Mark Wang, Wenhui Wang, Yanbin Shao 2005-05-17
6879746 Miniature 2×2 magneto-optic switch Qing Shao 2005-04-12
6873757 Multiple optical switches using refractive optics Qing Shao 2005-03-29
6624889 Cascaded filter employing an AOTF and narrowband birefringent filters 2003-09-23
6155973 Universal endoscope video adaptor with zoom Allen R. Howes 2000-12-05
6113533 Endoscope video adapter with zoom Allen R. Howes 2000-09-05