Issued Patents All Time
Showing 25 most recent of 51 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10367882 | Offline content distribution networks | Arun Prakash, Areef Reza, Bo Shen | 2019-07-30 |
| 9730033 | Offline content distribution networks | Arun Prakash, Areef Reza, Bo Shen | 2017-08-08 |
| 9374685 | Offline content distribution networks | Arun Prakash, Areef Reza, Bo Shen | 2016-06-21 |
| 9197696 | Offline content distribution networks | Arun Prakash, Areef Raza, Bo Shen | 2015-11-24 |
| 8407630 | Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing | Kevin Chan, Emmanuel Drege, Svetlana Litvintseva, Mark A. Miller, Francis Raquel | 2013-03-26 |
| 8156450 | Method and system for mask optimization | Kevin Chan, Emmanuel Drege, Svetlana Litvintseva, Mark A. Miller, Francis Raquel | 2012-04-10 |
| 8146024 | Method and system for process optimization | Kevin Chan, Emmanuel Drege, Svetlana Litvintseva, Mark A. Miller, Francis Raquel | 2012-03-27 |
| 8136068 | Methods, systems, and computer program products for implementing compact manufacturing models in electronic design automation | Li Song, Srini Doddi, Emmanuel Drego | 2012-03-13 |
| 7831528 | Optical metrology of structures formed on semiconductor wafers using machine learning systems | Srinivas Doddi, Emmanuel Drege, Junwei Bao | 2010-11-09 |
| 7694244 | Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing | Kevin Chan, Emmanuel Drege, Svetlana Litvintseva, Mark A. Miller, Francis Raquel | 2010-04-06 |
| 7665048 | Method and system for inspection optimization in design and production of integrated circuits | Kevin Chan, Emmanuel Drege, Svetlana Litvintseva, Mark A. Miller, Francis Raquel | 2010-02-16 |
| 7593119 | Generation of a library of periodic grating diffraction signals | Xinhui Niu | 2009-09-22 |
| 7580823 | Generation and use of integrated circuit profile-based simulation information | Xinhui Niu, Junwei Bao | 2009-08-25 |
| 7505153 | Model and parameter selection for optical metrology | Vi Vuong, Emmanuel Drege, Junwei Bao, Srinivas Doddi, Xinhui Niu | 2009-03-17 |
| 7474993 | Selection of wavelengths for integrated circuit optical metrology | Srinivas Doddi, Lawrence Lane, Vi Vuong, Michael Laughery, Junwei Bao +2 more | 2009-01-06 |
| 7450232 | Generic interface for an optical metrology system | Shifang Li, Junwei Bao, Xinhui Niu | 2008-11-11 |
| 7394554 | Selecting a hypothetical profile to use in optical metrology | Vi Vuong, Junwei Bao, Srinivas Doddi, Emmanuel Drege, Jin Wen +3 more | 2008-07-01 |
| 7330279 | Model and parameter selection for optical metrology | Vi Vuong, Emmanuel Drege, Junwei Bao, Srinivas Doddi, Xinhui Niu | 2008-02-12 |
| 7277189 | Generation of a library of periodic grating diffraction signals | Xinhui Niu | 2007-10-02 |
| 7271902 | Generic interface for an optical metrology system | Shifang Li, Junwei Bao, Xinhui Niu | 2007-09-18 |
| 7216045 | Selection of wavelengths for integrated circuit optical metrology | Srinivas Doddi, Lawrence Lane, Vi Vuong, Mike Laughery, Junwei Bao +2 more | 2007-05-08 |
| 7136796 | Generation and use of integrated circuit profile-based simulation information | Xinhui Niu, Junwei Bao | 2006-11-14 |
| 7092110 | Optimized model and parameter selection for optical metrology | Raghu Balasubramanian, Sanjay K. Yedur, Vi Vuong | 2006-08-15 |
| 7072049 | Model optimization for structures with additional materials | Xinhui Niu | 2006-07-04 |
| 7064829 | Generic interface for an optical metrology system | Shifang Li, Junwei Bao, Xinhui Niu | 2006-06-20 |