Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733996 | Intelligent software patch management | Kannan Parthasarathy, Hayden Davis | 2023-08-22 |
| 11526347 | Intelligent software patch management | Kannan Parthasarathy, Hayden Davis | 2022-12-13 |
| 10630706 | Modeling behavior in a network | Ravi Kumar Devi Reddy, Mahendra Kumar Kutare, Christophe Briguet | 2020-04-21 |
| 10389742 | Security feature extraction for a network | Ravi Kumar Devi Reddy, Mahendra Kumar Kutare, Christophe Briguet | 2019-08-20 |
| 10305922 | Detecting security threats in a local network | Ravi Kumar Devi Reddy, Mahendra Kumar Kutare, Christophe Briguet | 2019-05-28 |
| 8677301 | Method and system for model-based design and layout of an integrated circuit | Ya-Chieh Lai, Frank E. Gennari, Matthew W. Moskewicz, Junjiang Lei, Weiping Fang +1 more | 2014-03-18 |
| 8645887 | Method and system for model-based design and layout of an integrated circuit | Ya-Chieh Lai, Frank E. Gennari, Matthew W. Moskewicz, Junjiang Lei, Weiping Fang +1 more | 2014-02-04 |
| 8561184 | System, method and computer program product for comprehensive collusion detection and network traffic quality prediction | Robert Lee Marsa | 2013-10-15 |
| 8533825 | System, method and computer program product for collusion detection | Robert Lee Marsa | 2013-09-10 |
| 8381152 | Method and system for model-based design and layout of an integrated circuit | Ya-Chieh Lai, Frank E. Gennari, Matthew W. Moskewicz, Junjiang Lei, Weiping Fang +1 more | 2013-02-19 |
| 8302052 | Methods, systems, and computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit design | Brian Lee, Ron Pyke, Taber H. Smith, Emmanuel Drege | 2012-10-30 |
| 7831528 | Optical metrology of structures formed on semiconductor wafers using machine learning systems | Emmanuel Drege, Nickhil Jakatdar, Junwei Bao | 2010-11-09 |
| 7523076 | Selecting a profile model for use in optical metrology using a machine learning system | Emmanuel Drege, Junwei Bao | 2009-04-21 |
| 7505153 | Model and parameter selection for optical metrology | Vi Vuong, Emmanuel Drege, Junwei Bao, Xinhui Niu, Nickhil Jakatdar | 2009-03-17 |
| 7474993 | Selection of wavelengths for integrated circuit optical metrology | Lawrence Lane, Vi Vuong, Michael Laughery, Junwei Bao, Kelly Barry +2 more | 2009-01-06 |
| 7428060 | Optimization of diffraction order selection for two-dimensional structures | Wen Jin, Shifang Li | 2008-09-23 |
| 7394554 | Selecting a hypothetical profile to use in optical metrology | Vi Vuong, Junwei Bao, Emmanuel Drege, Jin Wen, Sanjay K. Yedur +3 more | 2008-07-01 |
| 7330279 | Model and parameter selection for optical metrology | Vi Vuong, Emmanuel Drege, Junwei Bao, Xinhui Niu, Nickhil Jakatdar | 2008-02-12 |
| 7216045 | Selection of wavelengths for integrated circuit optical metrology | Lawrence Lane, Vi Vuong, Mike Laughery, Junwei Bao, Kelly Barry +2 more | 2007-05-08 |
| 6857114 | Clustering for data compression | — | 2005-02-15 |
| 6853942 | Metrology hardware adaptation with universal library | Emmanuel Drege, Junwei Bao, Vi Vuong | 2005-02-08 |
| 6842261 | Integrated circuit profile value determination | Junwei Bao, Wen Jin, Emmanuel Drege, Vi Vuong | 2005-01-11 |
| 6636843 | System and method for grating profile classification | Nickhil Jakatdar, Xinhui Niu | 2003-10-21 |
| 6609086 | Profile refinement for integrated circuit metrology | Junwei Bao, Nickhil Jakatdar, Vi Vuong | 2003-08-19 |
| 6591405 | Clustering for data compression | — | 2003-07-08 |