| 11733996 |
Intelligent software patch management |
Kannan Parthasarathy, Hayden Davis |
2023-08-22 |
$15,211,000 |
| 11526347 |
Intelligent software patch management |
Kannan Parthasarathy, Hayden Davis |
2022-12-13 |
$38,698,000 |
| 10630706 |
Modeling behavior in a network |
Ravi Kumar Devi Reddy, Mahendra Kumar Kutare, Christophe Briguet |
2020-04-21 |
$7,560,000 |
| 10389742 |
Security feature extraction for a network |
Ravi Kumar Devi Reddy, Mahendra Kumar Kutare, Christophe Briguet |
2019-08-20 |
$12,100,000 |
| 10305922 |
Detecting security threats in a local network |
Ravi Kumar Devi Reddy, Mahendra Kumar Kutare, Christophe Briguet |
2019-05-28 |
$11,835,000 |
| 8677301 |
Method and system for model-based design and layout of an integrated circuit |
Ya-Chieh Lai, Frank E. Gennari, Matthew W. Moskewicz, Junjiang Lei, Weiping Fang +1 more |
2014-03-18 |
$5,778,000 |
| 8645887 |
Method and system for model-based design and layout of an integrated circuit |
Ya-Chieh Lai, Frank E. Gennari, Matthew W. Moskewicz, Junjiang Lei, Weiping Fang +1 more |
2014-02-04 |
$3,914,000 |
| 8561184 |
System, method and computer program product for comprehensive collusion detection and network traffic quality prediction |
Robert Lee Marsa |
2013-10-15 |
|
| 8533825 |
System, method and computer program product for collusion detection |
Robert Lee Marsa |
2013-09-10 |
|
| 8381152 |
Method and system for model-based design and layout of an integrated circuit |
Ya-Chieh Lai, Frank E. Gennari, Matthew W. Moskewicz, Junjiang Lei, Weiping Fang +1 more |
2013-02-19 |
$5,612,000 |
| 8302052 |
Methods, systems, and computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit design |
Brian Lee, Ron Pyke, Taber H. Smith, Emmanuel Drege |
2012-10-30 |
|
| 7831528 |
Optical metrology of structures formed on semiconductor wafers using machine learning systems |
Emmanuel Drege, Nickhil Jakatdar, Junwei Bao |
2010-11-09 |
|
| 7523076 |
Selecting a profile model for use in optical metrology using a machine learning system |
Emmanuel Drege, Junwei Bao |
2009-04-21 |
|
| 7505153 |
Model and parameter selection for optical metrology |
Vi Vuong, Emmanuel Drege, Junwei Bao, Xinhui Niu, Nickhil Jakatdar |
2009-03-17 |
|
| 7474993 |
Selection of wavelengths for integrated circuit optical metrology |
Lawrence Lane, Vi Vuong, Michael Laughery, Junwei Bao, Kelly Barry +2 more |
2009-01-06 |
|
| 7428060 |
Optimization of diffraction order selection for two-dimensional structures |
Wen Jin, Shifang Li |
2008-09-23 |
|
| 7394554 |
Selecting a hypothetical profile to use in optical metrology |
Vi Vuong, Junwei Bao, Emmanuel Drege, Jin Wen, Sanjay K. Yedur +3 more |
2008-07-01 |
|
| 7330279 |
Model and parameter selection for optical metrology |
Vi Vuong, Emmanuel Drege, Junwei Bao, Xinhui Niu, Nickhil Jakatdar |
2008-02-12 |
|
| 7216045 |
Selection of wavelengths for integrated circuit optical metrology |
Lawrence Lane, Vi Vuong, Mike Laughery, Junwei Bao, Kelly Barry +2 more |
2007-05-08 |
|
| 6857114 |
Clustering for data compression |
— |
2005-02-15 |
|
| 6853942 |
Metrology hardware adaptation with universal library |
Emmanuel Drege, Junwei Bao, Vi Vuong |
2005-02-08 |
|
| 6842261 |
Integrated circuit profile value determination |
Junwei Bao, Wen Jin, Emmanuel Drege, Vi Vuong |
2005-01-11 |
|
| 6636843 |
System and method for grating profile classification |
Nickhil Jakatdar, Xinhui Niu |
2003-10-21 |
|
| 6609086 |
Profile refinement for integrated circuit metrology |
Junwei Bao, Nickhil Jakatdar, Vi Vuong |
2003-08-19 |
|
| 6591405 |
Clustering for data compression |
— |
2003-07-08 |
|
