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Xinhui Niu — 42 Patents

TTTimbre Technologies: 37 patents #1 of 39Top 3%

TLTokyo Electron Limited: 4 patents #1,723 of 5,567Top 35%

San Jose, CA: #1,306 of 32,062 inventorsTop 5%

California: #10,667 of 386,348 inventorsTop 3%

Overall (All Time): #72,062 of 4,157,543Top 2%

42 Patents All Time

Xinhui Niu has been granted 42 US patents while listed as an inventor at Timbre Technologies. The first was granted in 2002 and the most recent in December 2009. Xinhui Niu ranks #72,062 of 4,157,543 US inventors in our database (top 1.7%). Patent records list Xinhui Niu in San Jose, CA, US.

Patents per Year

Issued Patents All Time

Showing 1–25 of 42 patents

Patent #	Title	Co-Inventors	Date
7630873	Approximating eigensolutions for use in determining the profile of a structure formed on a semiconductor wafer	Joerg Bischoff, Karl Hehl, Wen Jin	2009-12-08
7593119	Generation of a library of periodic grating diffraction signals	Nickhil Jakatdar	2009-09-22
7586623	Optical metrology of single features	Joerg Bischoff, Junwei Bao	2009-09-08
7580823	Generation and use of integrated circuit profile-based simulation information	Nickhil Jakatdar, Junwei Bao	2009-08-25
7505153	Model and parameter selection for optical metrology	Vi Vuong, Emmanuel Drege, Junwei Bao, Srinivas Doddi, Nickhil Jakatdar	2009-03-17
7450232	Generic interface for an optical metrology system	Shifang Li, Junwei Bao, Nickhil Jakatdar	2008-11-11
7427521	Generating simulated diffraction signals for two-dimensional structures	Joerg Bischoff	2008-09-23
7414733	Azimuthal scanning of a structure formed on a semiconductor wafer	Joerg Bischoff, Shifang Li	2008-08-19
7379192	Optical metrology of single features	Joerg Bischoff, Junwei Bao	2008-05-27
7330279	Model and parameter selection for optical metrology	Vi Vuong, Emmanuel Drege, Junwei Bao, Srinivas Doddi, Nickhil Jakatdar	2008-02-12
7277189	Generation of a library of periodic grating diffraction signals	Nickhil Jakatdar	2007-10-02
7271902	Generic interface for an optical metrology system	Shifang Li, Junwei Bao, Nickhil Jakatdar	2007-09-18
7224471	Azimuthal scanning of a structure formed on a semiconductor wafer	Joerg Bischoff, Shifang Li	2007-05-29
7136796	Generation and use of integrated circuit profile-based simulation information	Nickhil Jakatdar, Junwei Bao	2006-11-14
7072049	Model optimization for structures with additional materials	Nickhil Jakatdar	2006-07-04
7064829	Generic interface for an optical metrology system	Shifang Li, Junwei Bao, Nickhil Jakatdar	2006-06-20
7041515	Balancing planarization of layers and the effect of underlying structure on the metrology signal	Nickhil Jakatdar	2006-05-09
7031894	Generating a library of simulated-diffraction signals and hypothetical profiles of periodic gratings	Nickhil Jakatdar	2006-04-18
7030999	Optical metrology of single features	Joerg Bischoff, Junwei Bao	2006-04-18
6961679	Method and system of dynamic learning through a regression-based library generation process	Nickhil Jakatdar	2005-11-01
6952271	Caching of intra-layer calculations for rapid rigorous coupled-wave analyses	Nickhil Jakatdar	2005-10-04
6947141	Overlay measurements using zero-order cross polarization measurements	Joerg Bischoff	2005-09-20
6943900	Generation of a library of periodic grating diffraction signals	Nickhil Jakatdar	2005-09-13
6928395	Method and system for dynamic learning through a regression-based library generation process	Nickhil Jakatdar	2005-08-09
6891626	Caching of intra-layer calculations for rapid rigorous coupled-wave analyses	Nickhil Jakatdar	2005-05-10