Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11593650 | Determining confident data samples for machine learning models on unseen data | Min Zhang, Gopal B. Avinash, Zili Ma, Kevin H. LEUNG | 2023-02-28 |
| 11514329 | Data-driven deep learning model generalization analysis and improvement | Zili Ma, Min Zhang, Gopal B. Avinash | 2022-11-29 |
| 10684439 | System and method for mounting and aligning optical components with respect to junction optical component | Richard Sebastian | 2020-06-16 |
| 10684440 | System and method for mounting and aligning different size optical components using linked-rail mounting | Richard Sebastian | 2020-06-16 |
| 10374566 | Perceptual power reduction system and method | Vivek Nigam, Robert Polleros | 2019-08-06 |
| 10302893 | Optical component mount device and post system and method of use | James Fisher | 2019-05-28 |
| 9964728 | System and method for mounting and aligning optical components using single-rail mounting | Richard Sebastian | 2018-05-08 |
| 9607265 | Accurate and fast neural network training for library-based critical dimension (CD) metrology | Vi Vuong, Junwei Bao, Lie-Quan Lee, Leonid Poslavsky | 2017-03-28 |
| 9490183 | Nondestructive inline X-ray metrology with model-based library method | Junwei Bao | 2016-11-08 |
| 9059038 | System for in-situ film stack measurement during etching and etch control method | Shifang Li, Junwei Bao, Hanyou Chu, Ching-Ling Meng, Weiwen Xu +4 more | 2015-06-16 |
| 8577820 | Accurate and fast neural network training for library-based critical dimension (CD) metrology | Vi Vuong, Junwei Bao, Lie-Quan Lee, Leonid Poslavsky | 2013-11-05 |
| 8452718 | Determination of training set size for a machine learning system | Vi Vuong, Walter D. Mieher | 2013-05-28 |
| 8381140 | Wide process range library for metrology | John J. Hench, Junwei Bao | 2013-02-19 |
| 8221659 | Method and apparatus for the dry release of a compliant ophthalmic article from a mold surface | Kevin D. Beebe, William J. Seyboth, Raymond Walker, Sanjay Rastogi, Mahendra Nandu +1 more | 2012-07-17 |
| 8038912 | Method and apparatus for the dry release of a compliant ophthalmic article from mold surface | Kevin D. Beebe, William J. Seyboth, Raymond Walker, Sanjay Rastogi, Mahendra Nandu +1 more | 2011-10-18 |
| 7630873 | Approximating eigensolutions for use in determining the profile of a structure formed on a semiconductor wafer | Joerg Bischoff, Karl Hehl, Xinhui Niu | 2009-12-08 |
| 7567352 | Controlling a fabrication tool using support vector machine | Junwei Bao, Shifang Li, Manuel Madriaga | 2009-07-28 |
| 7511835 | Optical metrology using a support vector machine with simulated diffraction signal inputs | Junwei Bao, Shifang Li | 2009-03-31 |
| 7483809 | Optical metrology using support vector machine with profile parameter inputs | Junwei Bao, Shifang Li | 2009-01-27 |
| 7428060 | Optimization of diffraction order selection for two-dimensional structures | Srinivas Doddi, Shifang Li | 2008-09-23 |
| 7372583 | Controlling a fabrication tool using support vector machine | Junwei Bao, Shifang Li, Manuel Madriaga | 2008-05-13 |
| 7311194 | Lens mounting fixture for accommodating IOL | Charles P. Henning, Larry Hovey, Ted Foos | 2007-12-25 |
| 7281699 | Universal accommodating IOL holder for lens processing and packaging | Larry Hovey, Charles P. Henning, Ted Foos, William J. Appleton | 2007-10-16 |
| 6842261 | Integrated circuit profile value determination | Junwei Bao, Emmanuel Drege, Srinivas Doddi, Vi Vuong | 2005-01-11 |