Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11423575 | Indirect determination of dynamic dark level of an imaging device | Feng Ma | 2022-08-23 |
| 9059038 | System for in-situ film stack measurement during etching and etch control method | Shifang Li, Junwei Bao, Hanyou Chu, Wen Jin, Ching-Ling Meng +4 more | 2015-06-16 |