Issued Patents All Time
Showing 26–50 of 100 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10372113 | Method for defocus detection | Xuguang Jiang, Yong Zhang | 2019-08-06 |
| 10259448 | Hybrid vehicle propulsion systems and methods | Norman K. Bucknor, Suresh Gopalakrishnan, Lei Hao, Derek F. Lahr, Dongxu Li +6 more | 2019-04-16 |
| 10125710 | Detection of reversion based on mass air flow sensor readings | Yiran Hu, Chen-Fang Chang | 2018-11-13 |
| 10107165 | Method and apparatus for controlling reductant injection into an exhaust gas feedstream of an internal combustion engine | Min Sun, Anthony B. Will, Ping Ge, Gongshin Qi | 2018-10-23 |
| 10088298 | Method of improving lateral resolution for height sensor using differential detection technology for semiconductor inspection and metrology | — | 2018-10-02 |
| 9958257 | Increasing dynamic range of a height sensor for inspection and metrology | — | 2018-05-01 |
| 9938908 | System and method for predicting a pedal position based on driver behavior and controlling one or more engine actuators based on the predicted pedal position | Yue Wang, Chen-Fang Chang, Christopher E. Whitney | 2018-04-10 |
| 9927780 | System and method for adjusting target actuator values of an engine using model predictive control to satisfy emissions and drivability targets and maximize fuel efficiency | Min Sun, Giuseppe Mazzara Bologna, Francesco Cianflone, Paolo Nalbone | 2018-03-27 |
| 9909481 | System and method for determining target actuator values of an engine using model predictive control while satisfying emissions and drivability targets and maximizing fuel efficiency | Min Sun, Francesco Cianflone, Paolo Nalbone | 2018-03-06 |
| 9885656 | Line scan knife edge height sensor for semiconductor inspection and metrology | Paul Horn | 2018-02-06 |
| 9863756 | Line scan spectroscopic white light interferometry for semiconductor inspection and metrology | — | 2018-01-09 |
| 9803532 | Predictive control of ammonia storage in a selective catalytic reduction device using connectivity information | Min Sun | 2017-10-31 |
| 9771851 | Method and apparatus for controlling an internal combustion engine coupled to an exhaust aftertreatment system | Min Sun, Giuseppe Mazzara Bologna, Joshua Clifford Bedford | 2017-09-26 |
| 9747520 | Systems and methods for enhancing inspection sensitivity of an inspection tool | Youxian Wen, Sven Schwitalla, Prashant Aji, Lena Nicolaides | 2017-08-29 |
| 9739190 | Method and apparatus to control reductant injection into an exhaust gas feedstream | Min Sun, Kevin Andrew Gady, Raffaello Ardanese, Giuseppe Mazzara Bologna | 2017-08-22 |
| 9709543 | Method and apparatus for determining NOx content in an exhaust gas feedstream of an internal combustion engine | Min Sun | 2017-07-18 |
| 9709386 | Apparatus and methods for measuring properties in a TSV structure using beam profile reflectometry | Lena Nicolaides, Timothy Goodwin, Raul V. Tan | 2017-07-18 |
| 9658150 | System and method for semiconductor wafer inspection and metrology | Youxian Wen | 2017-05-23 |
| 9644543 | Prediction of intake manifold pressure in an engine system | Yiran Hu, Ibrahim Haskara, Sai S. V. Rajagopalan, Steven E. Muldoon, Chen-Fang Chang | 2017-05-09 |
| 9640449 | Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopy | Timothy Goodwin, Lena Nicolaides, Mohan Mahadevan, Paul Horn | 2017-05-02 |
| 9625937 | Computation efficiency by diffraction order truncation | Joerg Bischoff, Weidong Yang, Hanyou Chu | 2017-04-18 |
| 9494488 | Method and apparatus to determine rotational position of a phaser in a variable phasing system | Jyh-Shin Chen | 2016-11-15 |
| 9482164 | Engine control using calculated cylinder air charge | Hossein Javaherian, Yiran Hu, Jun-Mo Kang, Chen-Fang Chang | 2016-11-01 |
| 9115987 | Optical metrology with multiple angles of incidence and/or azimuth angles | Zhuan Liu | 2015-08-25 |
| 9103664 | Automated process control using an adjusted metrology output signal | Manuel Madriaga | 2015-08-11 |